Apparatus for profile irregularity measurement and surface imperfection observation; method of profile irregularity measurement and surface imperfection observation; and inspection method of profile irregularity and surface imperfection

• US 20090195788A1
• Filed: 12/16/2008
• Published: 08/06/2009
• Est. Priority Date: 12/17/2007
• Status: Abandoned Application

• Current Assignee: Olympus Corporation
• Original Assignee: Olympus Corporation
• Inventors: Yamazaki, Kazuhide, Dosaka, Shinichi
• Application Number:
  US12/316,839
• Publication Number:
  US 20090195788A1
• Time in Patent Office: Days
• US Class Current: 356/511
• CPC Class Codes: G01B 11/2441 using interferometry
• CPC Class Codes: G01M 11/0271 by using interferometric methods
• CPC Class Codes: G01M 11/0278 Detecting defects of the object to be tested, e.g. scratches or dust investigating the presence of flaws or contamination on materials by optical means G01N21/88
• CPC Class Codes: G01N 21/951 Balls

Abstract

An apparatus for performing surface measurement of an inspection-object surface and profile irregularity measurement and surface defect observation of an inspection-object lens using a Fizeau interferometric optical system. The apparatus is provided with a beam control device that has a first beam control plate configured to allow for confirmation of a position of the inspection-object lens in a positional adjustment of the inspection-object lens, a second beam control plate having an aperture region at a center thereof and a shading region around the aperture region, and a third beam control plate having a shading region at a center thereof and an aperture region around the shading region, and that is configured so that a desired one of these beam control plates is insertable and removable on an imaginary plane in which a light convergence point of reflected light from the reference surface of the interferometric optical system lies and which is perpendicular to an optical axis of the interferometric optical system.

Claims

1. An apparatus for profile irregularity measurement and surface imperfection observation of an inspection-object surface of an inspection-object lens, using a Fizeau interferometric optical system, comprising a beam control device,

wherein the beam control device has:

a first beam control plate constructed and arranged to allow for confirmation of a position of the inspection-object lens in a positional adjustment of the inspection-object lens;

a second beam control plate having an aperture region at a center thereof and a shading region around the aperture region; and

a third beam control plate having a shading region at a center thereof and an aperture region around the shading region, and

is constructed and arranged so that a desired one of the beam control plates is insertable and removable on an imaginary plane in which a light convergence point of reflected light from a reference surface of the interferometric optical system lies and which is perpendicular to an optical axis of the interferometric optical system.

2. An apparatus for profile irregularity measurement and surface imperfection observation according to claim 1, wherein the apparatus has a positional adjustment device that can move the inspection-object lens in a predetermined direction in reference to the optical axis of the interferometric optical system.

3. An apparatus for profile irregularity measurement and surface imperfection observation according to claim 1, wherein the apparatus comprises:

an imaging optical system that forms an image, at a predetermined image position, of an image of the inspection object formed in a vicinity of the light convergence point; and

an optical system for observation of an image of the first beam control plate disposed on the imaginary plane in which the light convergence point lies and which is perpendicular to the optical axis of the interferometric optical system, having a same image position as the imaging optical system;

each of the imaging optical system and the optical system for observation of an image of the first beam control plate being insertable and removable in and out of a path of rays of the interferometric optical system, and

wherein the apparatus further comprises an image capture device arranged at the image position.

4. A method of profile irregularity measurement and surface imperfection observation of an inspection-object surface of an inspection-object lens using a Fizeau interferometric optical system, comprising:

a first process of setting a first beam control plate configured to be capable of confirming a position of the inspection-object lens on an imaginary plane in which a light convergence point of reflected light from a reference surface of the interferometric optical system lies and which is perpendicular to an optical axis of the interferometric optical system while adjusting a position of the inspection-object lens so that light emergent from a reference surface of the interferometric optical system is incident on a surface of the inspection-object lens perpendicular thereto;

a second process of performing interference fringe observation upon exchanging the first beam control plate for a second beam control plate having an aperture region at a center thereof and a shading region around the aperture region after the first process;

a third process of performing dark-field observation upon exchanging the second beam control plate for a third beam control plate having a shading region at a center thereof and an aperture region around the shading region after the second process; and

a fourth process of performing bright-field observation upon decentering the inspection-object lens after the third process.

5. A method of profile irregularity measurement and surface imperfection observation according to claim 4, wherein the third beam control plate includes a plurality of interchangeable beam control plates having annular aperture regions with different diameters around the center regions thereof.

6. An inspection method of profile irregularity and surface irregularity of an inspection-object surface of an inspection-object lens using a Fizeau interferometer, comprising:

a process of inspecting profile irregularity of the inspection-objectsurfaceusinginterferencefringesthataregenerated by superposition of reference light reflected from a reference surface and measurement light transmitted through the reference surface and reflected from the inspection-object surface, upon adjusting positions of the reference surface and the inspection-object surface; and

a process of inspecting surface imperfection of the inspection-object surface using the measurement light transmitted through the reference surface and reflected from the inspection-object surface upon adjusting the positions of the reference surface and the inspection-object surface to remove the reference light reflected from the reference surface.