WIRING SUBSTRATE FOR ELECTRONIC-COMPONENT INSPECTION APPARATUS
First Claim
1. A wiring substrate for an electronic-component inspection apparatus comprising:
- a substrate body composed of a plurality of stacked ceramic layers, said substrate body having a front surface and a back surface; and
front-surface terminal electrodes formed on the front surface of the substrate body, and grouped into unit inspection patterns, individual ones of the unit inspection patterns being constituted by a plurality of the front-surface terminal electrodes disposed so as to correspond to a plurality of terminal electrodes of individual electronic components to be inspected,wherein said unit inspection patterns are disposed so as to be offset distance-wise from a lattice arrangement in at least one of orthogonal first and second directions, as viewed from above the front surface of the substrate body.
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Accused Products
Abstract
A wiring substrate K for an electronic-component inspection apparatus includes a substrate body (1) composed of a plurality of stacked ceramic layers s1 to s8 and having a front surface (2) and a back surface (3); and front-surface terminal electrodes f formed on the front surface (2) of the substrate body (1). Unit inspection patterns a1, individual ones of which are constituted by a plurality of the front-surface terminal electrodes f disposed to correspond to a plurality of terminal electrodes m of a single electronic component cn to be inspected, are regularly disposed in vertical and horizontal directions as viewed from above such that the centroids g of the unit inspection patterns a1 coincide with alternate ones of intersections j between vertical imaginary lines L1 to L3 and horizontal imaginary lines N1 to N4 passing through the centroids g of the unit inspection patterns a1.
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Citations
18 Claims
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1. A wiring substrate for an electronic-component inspection apparatus comprising:
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a substrate body composed of a plurality of stacked ceramic layers, said substrate body having a front surface and a back surface; and front-surface terminal electrodes formed on the front surface of the substrate body, and grouped into unit inspection patterns, individual ones of the unit inspection patterns being constituted by a plurality of the front-surface terminal electrodes disposed so as to correspond to a plurality of terminal electrodes of individual electronic components to be inspected, wherein said unit inspection patterns are disposed so as to be offset distance-wise from a lattice arrangement in at least one of orthogonal first and second directions, as viewed from above the front surface of the substrate body. - View Dependent Claims (4, 7, 10, 13, 16)
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2. A wiring substrate for an electronic-component inspection apparatus comprising:
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a substrate body composed of a plurality of stacked ceramic layers, said substrate body having a front surface and a back surface; and front-surface terminal electrodes formed on the front surface of the substrate body, and grouped into unit inspection patterns, individual ones of the unit inspection patterns being constituted by a plurality of the front-surface terminal electrodes disposed so as to correspond to a plurality of terminal electrodes of individual electronic components to be inspected, wherein said unit inspection patterns are disposed so as to be offset distance-wise from a lattice arrangement of rows and columns in at least one of orthogonal first and second directions, as viewed from above the front surface of the substrate body, wherein the unit inspection patterns are arranged in every other row but not in alternate rows in at least one of the first and second directions. - View Dependent Claims (5, 8, 11, 14, 17)
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3. A wiring substrate for an electronic-component inspection apparatus comprising:
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a substrate body composed of a plurality of stacked ceramic layers, said substrate body having a front surface and a back surface; and front-surface terminal electrodes formed on the front surface of the substrate body, and grouped into unit inspection patterns, individual ones of the unit inspection patterns being constituted by a plurality of the front-surface terminal electrodes disposed so as to correspond to a plurality of terminal electrodes of individual electronic components to be inspected, wherein said unit inspection patterns are regularly arranged in orthogonal first and second directions, as viewed from above the front surface of the substrate body, such that centroids of the respective unit inspection patterns coincide with alternate ones of intersections between first imaginary lines and second imaginary lines extending along the first and second directions, respectively, and passing through the centroids of the unit inspection patterns. - View Dependent Claims (6, 9, 12, 15, 18)
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Specification