Data signal handling circuitry and methods with error analysis capabilities
First Claim
1. An electronic device comprising:
- a component that receives a data signal and that processes data from that signal through a series of circuit layers, beginning with a relatively low level circuit layer that initially receives the data signal, and ending with a relatively high level circuit layer that performs an application on data from the data signal, the relatively low level circuit layer outputting from the component an error signal containing an error indication substantially concurrent with the relatively low level circuit layer detecting a data error in the data signal.
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Accused Products
Abstract
To help identify a noise (interference) source in an electronic device that may be causing data errors in the device, relatively low level data receiver circuitry in the device is provided with one or more error signal output leads. An error signal on such a lead includes an error indication as soon as possible after the associated low level circuitry detects a data error. The timing of such an error indication is compared to the timing of noise from various possible noise sources in the device. The noise source that produced significant noise closest in time prior to the error indication may be identified as the noise source that was probably responsible for the data error that caused the error indication.
34 Citations
26 Claims
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1. An electronic device comprising:
a component that receives a data signal and that processes data from that signal through a series of circuit layers, beginning with a relatively low level circuit layer that initially receives the data signal, and ending with a relatively high level circuit layer that performs an application on data from the data signal, the relatively low level circuit layer outputting from the component an error signal containing an error indication substantially concurrent with the relatively low level circuit layer detecting a data error in the data signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A method of testing an electronic device including a component that receives a data signal and that processes data from that signal through a series of circuit layers, beginning with a relatively low level circuit layer that initially receives the data signal, and ending with a relatively high level circuit layer that performs an application on data from the data signal, the method comprising:
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causing the relatively low level circuit layer to output from the component an error signal containing an error indication substantially concurrent with the relatively low level circuit layer detecting a data error in the data signal; and comparing timing of the error indication in the error signal and a noise indication in a noise signal, the noise signal containing noise indications substantially concurrent with noise produced by a noise source of the electronic device. - View Dependent Claims (23, 24, 25, 26)
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Specification