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SINGLE EVENT TRANSIENT MITIGATION AND MEASUREMENT IN INTEGRATED CIRCUITS

  • US 20090204933A1
  • Filed: 01/29/2009
  • Published: 08/13/2009
  • Est. Priority Date: 01/28/2008
  • Status: Active Grant
First Claim
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1. A method for single event transient filtering of an end user logic design, the logic design including design constraints, in a programmable logic integrated circuit device, the device having physical programmable elements and control elements associated with the programmable elements, the method comprising:

  • (a) converting the end user logic design to virtual programmable elements;

    (b) identifying locations requiring SET filters;

    (c) generating the SET filters out of virtual programmable elements, combining the SET filter virtual programmable elements with the end user logic design virtual programmable elements, and mapping all of the virtual programmable elements into the physical programmable elements of the programmable logic integrated circuit device; and

    (d) creating a data structure for programming the control elements.

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