PROGRAM METHOD OF FLASH MEMORY DEVICE
First Claim
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1. A program method of a flash memory device including a plurality of MLCs that share word lines and bit lines, the program method comprising the steps of:
- selecting one of the word lines;
first programming the MLCs connected to the selected word line by applying a first program voltage that gradually rises from a start program voltage at the ratio of a first step voltage to the selected word line; and
first programming the MLCs connected to the selected word line by applying a second program voltage that gradually rises from the first program voltage, which has finally risen in the first program step, at the ratio of a second step voltage.
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Abstract
Erase and program methods of a flash memory device including MLCs for increasing the program speed are described. In the erase method, MLCs are pre-programmed so that a voltage range in which threshold voltages of MLCs are distributed can be reduced. Therefore, a fail occurrence ratio can be reduced when erasing MLCs, the threshold voltage distribution of MLCs can be improved and an overall program time can be shortened in a subsequent program operation.
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Citations
6 Claims
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1. A program method of a flash memory device including a plurality of MLCs that share word lines and bit lines, the program method comprising the steps of:
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selecting one of the word lines; first programming the MLCs connected to the selected word line by applying a first program voltage that gradually rises from a start program voltage at the ratio of a first step voltage to the selected word line; and first programming the MLCs connected to the selected word line by applying a second program voltage that gradually rises from the first program voltage, which has finally risen in the first program step, at the ratio of a second step voltage. - View Dependent Claims (2, 3, 4, 5, 6)
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Specification