Optical Measuring Apparatus, Optical Measuring Method, and Storage Medium that Stores Optical Measuring Program
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Abstract
The present invention provides an optical measuring apparatus and an optical measuring method for being able to correct the influence of a superficial tissue to be able to accurately measure a degree of light absorption of a deep layer tissue such as a human body and fruits, and a storage medium that stores an optical measuring program. The optical measuring apparatus includes a probe, and the probe includes one light emitting diode and two photodiodes. In a configuration of the optical measuring apparatus, one of the photodiodes receives light which is emitted from the light emitting diode and transmitted through a superficial layer and a deep layer of a tissue, and the other photodiode receives light having a deep layer transmission distance different from that of the light received by one of the photodiodes. The light received by the other photodiode is also transmitted through the superficial layer and deep layer of the tissue. Based on intensity of the light received by each photodiode, a control unit computes a propagation constant in a medium through which the light propagates. An arithmetic expression is selected in accordance with an input fat thickness of the tissue, and an absorption coefficient of the light from a muscle tissue using the arithmetic expression based on the fat thickness and a spatial slope. A hemoglobin concentration and an oxygen saturation are obtained based on the obtained absorption coefficient of the light.
17 Citations
16 Claims
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1-8. -8. (canceled)
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9. An optical measuring apparatus comprising:
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a light emitter for irradiating with light a layered structure which is an object of measurement, the layered structure comprising a plurality of layers including at least a superficial layer and a deep layer; a light receiver for receiving, at a position at a first predetermined distance from the light emitter, light emitted from the light emitter and transmitted through the superficial layer and the deep layer, and for receiving, at a position at a second predetermined distance from the light emitter, light which is emitted from the light emitter and transmitted through the superficial layer and the deep layer and which has a deep layer transmission distance which is different from that of the light received at the position at the first predetermined distance from the light emitter; a spatial slope computation device for obtaining a spatial slope based on intensities of the light received at the position at the first predetermined distance from the light emitter and the light received at the position at the second predetermined distance from the light emitter; a storage means in which a computation parameter for computing a degree of light absorption in the deep layer is stored in each superficial thickness; an input device for inputting the superficial thickness; and computing means for reading the computation parameter from the storage means in accordance with the input superficial thickness, and obtaining the degree of light absorption in the deep layer based on the a quadratic function of the spatial slope including the read computation parameter. - View Dependent Claims (10, 11, 12, 13, 14)
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15. An optical measuring method comprising:
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irradiating with light a layered structure which is an object of measurement, the layered structure comprising a plurality of layers including at least a superficial layer and a deep layer; receiving, at a position at a first predetermined distance from a light irradiation position, light of the irradiation light which has been transmitted through the superficial layer and the deep layer, and receiving, at a position at a second predetermined distance from the light irradiation position, light of the irradiation light which has been transmitted through the superficial layer and the deep layer and which has a deep layer transmission distance which is different from that of the light received at the position at the first predetermined distance from the light irradiation position; obtaining a spatial slope based on intensities of the light received at the position at the first predetermined distance from the light irradiation position, the light received at the position at the second predetermined distance from the light irradiation position, the first predetermined distance, and the second predetermined distance; inputting the superficial thickness; and reading a computation parameter from a storage device in accordance with the input superficial thickness, where computation parameters for computing a degree of light absorption in the deep layer are stored for each superficial thickness in the storage device, and obtaining the degree of light absorption based on the read computation parameter and the spatial slope.
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16. A storage medium that stores an optical measuring program for causing a computer to execute processing, the processing including:
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irradiating with light a layered structure which is an object of measurement, the layered structure comprising a plurality of layers, the plurality of layers including at least a superficial layer and a deep layer; receiving, at a position at a first predetermined distance from a light irradiation position, light of the irradiation light which has been transmitted through the superficial layer and the deep layer, and receiving, at a position at a second predetermined distance from the light irradiation position, light of the irradiation light which has been transmitted through the superficial layer and the deep layer, and which has a deep layer transmission distance which is different from that of the light received at the position at the first predetermined distance from the light irradiation position; obtaining a spatial slope based on intensities of the light received at the position at the first predetermined distance from the light irradiation position, the light received at the position at the second predetermined distance from the light irradiation position, the first predetermined distance, and the second predetermined distance; inputting the superficial thickness; and reading a computation parameter from a device in accordance with the input superficial thickness, where computation parameters for computing a degree of light absorption in the deep layer are stored for each superficial thickness in the storage means, and obtaining the degree of light absorption based on the read computation parameter and the spatial slope.
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Specification