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In-Circuit Testing For Integrity Of Solid-State Switches

  • US 20090212975A1
  • Filed: 02/27/2008
  • Published: 08/27/2009
  • Est. Priority Date: 02/27/2008
  • Status: Active Grant
First Claim
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1. A method of testing first and second switches, wherein the first switch has first and second terminals and a control input, and wherein the second switch has first and second terminals and a control input, and wherein the second terminal of the first switch is in communication with the first terminal of the second switch, and wherein the first terminal of the first switch is adapted to be placed in communication with a power supply, and wherein the second terminal of the second switch is adapted to be placed in communication with a load, using a controller that is in communication with the control input of the first switch and the control input of the second switch, comprising the following steps performed in any order:

  • a. Causing the controller to direct the first switch to open and to direct the second switch to close; and

    causing the controller to sense the presence of power at the second terminal of the second switch, and, if power is present at the second terminal of the second switch, to indicate a fault;

    b. Causing the controller to direct the second switch to close, and causing the controller to direct the first switch to open; and

    causing the controller to sense the presence of power at the second terminal of the second switch, and, if power is present at the second terminal of the second switch, to indicate a fault.

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