Device Management Method, Analysis System Used Therein, Maintenance Inspection Support Method, and Maintenance Inspection Support Apparatus Used Therein

• US 20090228121A1
• Filed: 07/25/2006
• Published: 09/10/2009
• Est. Priority Date: 07/25/2005
• Status: Active Grant

• Current Assignee: TLV Co., Ltd.
• Original Assignee: TLV Co., Ltd.
• Inventors: Fujiwara, Yoshiyasu, Oda, Kazunori
• Granted Patent: US 8,914,252 B2
• Time in Patent Office: Days
• US Class Current: 700/81
• CPC Class Codes: F01K 13/006 Auxiliaries or details not otherwise provided for
• CPC Class Codes: F16T 1/48 Monitoring arrangements for inspecting, e.g. flow of steam and steam condensate
• CPC Class Codes: G06Q 10/20 Administration of product repair or maintenance
• CPC Class Codes: G07C 3/08 Registering or indicating the production of the machine either with or without registering working or idle time

Abstract

A complete test involving the entire number of devices in a large group of managed devices (T) is periodically performed to determine whether the devices are operating normally or have a malfunction; a test result (Ic) is recorded in a management database (Db) for each cycle of the complete test, and a device that has been found to be malfunctioning is repaired or replaced; and the suitability of a device model is determined or a suitable device model is selected for each of the managed devices (T) on the basis of history information (N) about each of the managed devices (T) obtained from the test result (Ic) of the complete test that spans a plurality of cycles, as recorded in the management database (Db).

Claims

1. A device management method comprising:

periodically performing a complete test involving the entire number of devices in a large group of managed devices to determine whether the devices are operating normally or have a malfunction;

recording a test result in a management database for each cycle of the complete test, and repairing or replacing a device that has been found to be malfunctioning; and

determining the suitability of a device model or selecting a suitable device model for each of the managed devices on the basis of history information about each of the managed devices obtained from the test result of the complete test that spans a plurality of cycles, as recorded in the management database.

2. The device management method according to claim 1, comprising:

performing a complete overhaul as an initial operation to replace the entire number of managed devices with recommended devices, and creating the management database for cumulatively recording a test result of the complete test; and

periodically performing the complete test thereafter.

3. The device management method according to claim 1, comprising:

performing a partial overhaul as an initial operation to repair, or to replace with recommended devices, only some of the managed devices, including all the malfunctioning devices from among the managed devices, and creating the management database for cumulatively recording a test result of the complete test; and

periodically performing the complete test thereafter.

4. The device management method according to any of claims 1 to 3, comprising:

recovering and then bringing to a reusable state and reusing a device that has been replaced as a result of a malfunction in each cycle of the complete test or as a result of a preset service period having elapsed.

5. An analysis system used in a device management operation comprising periodically performing a complete test involving the entire number of devices in a large group of managed devices to determine whether the devices are operating normally or have a malfunction;

recording a test result in a management database for each cycle of the complete test, and repairing or replacing a device that has been found to be malfunctioning; and

determining the suitability of a device model or selecting a suitable device model for each of the managed devices on the basis of history information about each of the managed devices obtained from the test result of the complete test that spans a plurality of cycles, as recorded in the management database, the analysis system comprising;

input means for inputting a test result of the complete test;

storage means for cumulatively storing the test result for each cycle of the complete test that is input by the input means; and

arithmetic means for creating, in accordance with a preset program, analysis data that shows history information about each of the managed devices on the basis of the test result of the complete test that spans a plurality of cycles, as stored in the storage means.

6. The analysis system according to claim 5, wherein the arithmetic means is configured to create the analysis data by using the malfunctioning frequency of each managed device as the history information.

7. An analysis system used in a device management operation comprising periodically performing a complete test involving the entire number of devices in a large group of managed devices to determine whether the devices are operating normally or have a malfunction;

recording a test result in a management database for each cycle of the complete test, and repairing or replacing a device that has been found to be malfunctioning; and

determining the suitability of a device model or selecting a suitable device model for each of the managed devices on the basis of history information about each of the managed devices obtained from the test result of the complete test that spans a plurality of cycles, as recorded in the management database, the analysis system comprising;

input means for inputting a test result of the complete test and a classification category to which each of the managed devices belongs;

storage means for cumulatively storing the test result for each cycle of the complete test that is input by the input means, and storing the applicable classification category of each of the managed devices that is input by the input means; and

arithmetic means for creating, in accordance with a preset program, analysis data that shows the relation between the history information about each of the managed devices and a plurality of the classification categories, or analysis data that shows the history information about each of the managed devices classified by the classification categories, on the basis of the test result of the complete test that spans a plurality of cycles and on the basis of the applicable classification category of each of the managed devices, as stored in the storage means.

8. The analysis system according to claim 7, wherein the arithmetic means is configured to create the analysis data by using the malfunctioning frequency of each of the managed devices as the history information.

9. A maintenance inspection support method for a maintenance inspection operation comprising periodically performing a complete test involving all the devices in a group of managed devices installed at a predetermined installation site to determine whether the devices are operating normally or have a malfunction, and repairing or replacing a device that has been found to be malfunctioning, the maintenance inspection support method comprising:

acquiring attribute information and a test result for each of the managed devices each time the complete test is performed;

combining the acquired test result and attribute information and storing the data in a management database;

creating analysis data on the basis of history information about each of the managed devices obtained from the test result that spans a plurality of cycles and is stored in the management database; and

generating, based on the analysis data, support information related to determining the suitability of a device model or selecting a suitable device model for each of the installation sites provided with the managed devices.

10. A maintenance inspection support apparatus for a maintenance inspection operation comprising periodically performing a complete test involving all the devices in a group of managed devices installed at a predetermined installation site to determine whether the devices are operating normally or have a malfunction, and repairing or replacing a device that has been found to be malfunctioning, the maintenance inspection support apparatus comprising:

a device attribute value acquisition unit for acquiring attribute information about each of the managed devices;

a device test data acquisition unit for acquiring a test result;

a device evaluation data generator for combining the acquired test result and the attribute information and generating device evaluation data;

a database management unit for appending a history code to the device evaluation data, storing the resulting data in a management database, and extracting device evaluation data that conforms to a search condition;

a device analysis processor for creating analysis data that shows history information about each of the managed devices on the basis of the test result included in the device evaluation data that spans a plurality of cycles and is stored in the management database; and

an assistance information generator for generating, based on the analysis data, support information related to determining the suitability of a device model or selecting a suitable device model for each of the installation sites provided with the managed devices.

11. The maintenance inspection support apparatus according to claim 10, further comprising:

a classification criteria table for storing a classification category to which each of the managed devices belongs; and

a classification processor for classifying the device evaluation data by such classification categories with reference to the classification criteria table;

the device analysis processor replacing the analysis data that shows history information about each of the managed devices and creating analysis data that shows the relation between the history information about each of the managed devices and the classification categories of the managed devices classified by the classification processor, or analysis data that shows the history information about each of the managed devices classified by the classification categories.