METHOD AND APPARATUS FOR PROCESSING FAILURES DURING SEMICONDUCTOR DEVICE TESTING
First Claim
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1. Apparatus for testing a device under test (DUT), comprising:
- fail capture logic, coupled to test probes and memory, to indicate only first failures of failures detected on output pins of the DUT during a test for storage in the memory.
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Abstract
Methods and apparatus for processing failures during semiconductor device testing are described. Examples of the invention can relate to testing a device under test (DUT). Fail capture logic can be provided, coupled to test probes and memory, to indicate only first failures of failures detected on output pins of the DUT during a test for storage in the memory.
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Citations
21 Claims
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1. Apparatus for testing a device under test (DUT), comprising:
fail capture logic, coupled to test probes and memory, to indicate only first failures of failures detected on output pins of the DUT during a test for storage in the memory. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A test assembly, comprising:
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a probe card assembly having test probes configured to contact pins of a device under test (DUT); test instruments having test channels coupled to a memory, each of the test channels including; fail capture logic, coupled to at least one of the test probes contacting at least one output pin of the pins, to indicate only first failures on the at least one output pin during a test for storage in the memory. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. A method of testing a device under test (DUT) using a probe card assembly, comprising:
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applying test signals to input pins of the DUT during a test via test probes supported on the probe card assembly; receiving test result signals derived from output pins of the DUT responsive to the test signals; and storing in a memory only indications of first failures on the output pins as identified based on the test result signals for the test. - View Dependent Claims (17, 18, 19, 20)
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21-40. -40. (canceled)
Specification