OPTICAL IMAGING APPARATUS AND METHOD FOR INSPECTING SOLAR CELLS
First Claim
Patent Images
1. An optical imaging apparatus for inspecting a solar cell, comprising:
- a power supply configured to apply a reverse biased voltage to the solar cell;
a thermal imaging device configured to obtain a thermal image of the solar cell; and
a computing unit including a thermal image analysis module configured to identify a hot spot in the thermal image and a locating module configured to locate the hot spot.
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Abstract
An optical imaging apparatus for inspecting a solar cell includes a power supply configured to apply a reverse biased voltage to the solar cell such that shunt defects in the solar cell will generate heat, a thermal imaging device configured to obtain the thermal image of the solar cell, a computing unit including a thermal image analysis module configured to identify hot spots in the thermal image, a locating module configured to locate the center positions of the hot spots, a visible image analysis module configured to identify the defect features of the hot spots, and a visible light imaging device configured to acquire visible images of the hot spots.
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Citations
17 Claims
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1. An optical imaging apparatus for inspecting a solar cell, comprising:
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a power supply configured to apply a reverse biased voltage to the solar cell; a thermal imaging device configured to obtain a thermal image of the solar cell; and a computing unit including a thermal image analysis module configured to identify a hot spot in the thermal image and a locating module configured to locate the hot spot. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method for inspecting a solar cell, comprising the steps of:
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applying a reverse biased voltage to the solar cell; obtaining a thermal image of the solar cell by a thermal imaging device; and identifying a hot spot having a temperature higher than a temperature threshold and a size larger than an area threshold. - View Dependent Claims (16, 17)
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Specification