×

METHOD AND MEASURING SYSTEM FOR CHARACTERIZING A DEVIATION OF AN ACTUAL DIMENSION OF A COMPONENT FROM A NOMINAL DIMENSION OF THE COMPONENT

  • US 20090248356A1
  • Filed: 03/27/2009
  • Published: 10/01/2009
  • Est. Priority Date: 03/28/2008
  • Status: Active Grant
First Claim
Patent Images

1. A method for characterizing a deviation of an actual dimension of a component from a nominal dimension of the component, comprising the steps of:

  • a) determining a measured value characterizing the actual dimension at a position of the component by a measuring device;

    b) making a nominal value available with which the nominal dimension is characterized as a function of the position of the measured value;

    c) determining a spatial distance between the measured value and the nominal value;

    d) making a limiting criterion available with which a permissible deviation from the nominal value is characterized as a function of the position of the measured value; and

    e) determining a tolerance utilization value characterizing a deviation for the measured value as a function of the spatial distance and of the limiting criterion.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×