Image Sensor System

• US 20090250614A1
• Filed: 04/02/2009
• Published: 10/08/2009
• Est. Priority Date: 04/07/2008
• Status: Active Grant

• Current Assignee: Diehl BGT Defence GmbH & Company KG (Diehl VA Systeme Stiftung & Company KG)
• Original Assignee: Diehl BGT Defence GmbH & Company KG (Diehl VA Systeme Stiftung & Company KG)
• Inventors: Zehetmair, Frank, Tholl, Hans Dieter, Barenz, Joachim
• Granted Patent: US 8,426,820 B2
• Time in Patent Office: Days
• US Class Current: 250/352
• CPC Class Codes: F41G 7/001 Devices or systems for testing or checking
• CPC Class Codes: F41G 7/2253 Passive homing systems, i.e. comprising a receiver and do not requiring an active illumination of the target
• CPC Class Codes: F41G 7/2293 using electromagnetic waves other than radio waves
• CPC Class Codes: G01J 2005/0077 Imaging
• CPC Class Codes: G01J 5/061 by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
• CPC Class Codes: G01J 5/53 Reference sources, e.g. standard lamps; Black bodies
• CPC Class Codes: H04N 17/002 for television cameras
• CPC Class Codes: H04N 23/20 for generating image signals from infrared radiation only
• CPC Class Codes: H04N 5/33 Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20

Abstract

An image sensor system includes a detector having a plurality of detector elements and optics having a beam path from an optical element on to the detector. Calibration of the detector can be rapidly effected where the image sensor system has a reference radiating device fixed within the beam path for illuminating the detector elements.

Claims

1. An image sensor system, comprising:

a detector having a plurality of detector elements;

optics defining a beam path from an optical element on to said detector; and

a reference radiating device disposed within said beam path for illuminating said detector elements.

2. The image sensor system according to claim 1, wherein said detector elements are configured to have a greatest sensitivity in an infrared spectral range, and further comprising a cooling system for cooling said detector elements.

3. The image sensor system according to claim 1, wherein said reference radiating device is configured to illuminate said detector elements while a surroundings is being imaged through said optics onto said detector elements.

4. The image sensor system according to claim 1, wherein said reference radiating device is disposed in a central masking-out part of said optics.

5. The image sensor system according to claim 1, wherein said optics is a catadioptic optics.

6. The image sensor system according to claim 1, wherein said optics includes a Cassegrain optical system.

7. The image sensor system according to claim 1, wherein said optics include an exit pupil, and said reference radiating device includes an optical element for producing an image of a radiation emitting element of said reference radiating device on said exit pupil of said optics.

8. The image sensor system according to claim 1, wherein said reference radiating device includes an optical element for spatially homogenizing a non-homogeneous radiation emission from a radiator of said reference radiating device.

9. The image sensor system according to claim 1, wherein said reference radiating device has a thermal radiating device forming a radiation emitting element thereof.

10. The image sensor system according to claim 1, wherein said reference radiating device has a diode forming a radiation emitting element thereof.

11. The image sensor system according to claim 1, which further comprises a closed-loop control device for controlling a radiation characteristic of said reference radiating device in dependence on a detector signal.

12. The image sensor system according to claim 11, wherein said close-loop control device is configured to regulate a radiation characteristic of said reference radiating device such that a plurality of different output characteristics of said detector elements are successively attained with the same integration time.

13. The image sensor system according to claim 1, which comprises an optical device configured to vary a radiation characteristic of the illumination of said detector elements by said reference radiating device.

14. The image sensor system according to claim 1, which comprises a processing means for calibration of said detector.

15. The image sensor system according to claim 14, wherein said processing means is provided for performing multi-point calibration on the basis of a single integration time.

16. The image sensor system according to claim 14, wherein said processing means is provided for controlling the irradiation of said detector elements by said radiation source.

17. The image sensor system according to claim 14, wherein said processing means is provided to control a movement of an optical element for movement of the illumination of said reference radiating device on said detector.

18. The image sensor system according to claim 14, wherein said processing means is provided to firstly effect calibration by means of said reference radiating device and then to perform post-calibration on the basis of the radiation incidence from a recorded scenery.