METHOD FOR PASSIVE DETERMINATION OF THE OPERATING TEMPERATURE IN A THERMALLY HIGHLY LOADED DEVICE, AND APPARATUS FOR CARRYING OUT THE METHOD

• US 20090252194A1
• Filed: 03/13/2009
• Published: 10/08/2009
• Est. Priority Date: 10/02/2006
• Status: Active Grant

• Current Assignee: General Electric Technology GmbH (GE Aerospace)
• Original Assignee: Alstom Technology Ltd. (Alstom SA)
• Inventors: GERMERDONK, Klaus, LANG, Peter, RABENSTEINER, Bernd, MOSER, Roland
• Granted Patent: US 8,342,745 B2
• Time in Patent Office: Days
• US Class Current: 374/110
• CPC Class Codes: G01K 1/026 arrangements for monitoring a plurality of temperatures, e.g. by multiplexing
• CPC Class Codes: G01K 3/005 Circuits arrangements for indicating a predetermined temperature fire detection G08B17/00

Abstract

A method is provided for determination of an operating temperature in a thermally highly loaded device. Multiple individual passive measurement elements, having a measurable physical parameter depending on a constant temperature set during heat treatment, are provided. The parameter is set differently for each of the different measurement elements which are combined to form an array. In a first measurement, values of the physical parameter for the array are determined before the array is subjected to the operating temperature. The array is subjected to the operating temperature in the device and in a second measurement, values are determined for all the measurement elements in the array. First and second measurement values of the physical parameter for each of the measurement elements are compared and the temperature of the heat treatment of that measurement element whose value of the physical parameter has changed the least is taken as the measured temperature.

Claims

1. A method for passive determination of an operating temperature (T_M) in a thermally highly loaded device (12), comprising:

providing a plurality of individual passive measurement elements (E1, . . . , En), which have at least one measurable physical parameter (P) that depends unambiguously on a constant temperature (T_HT) which is set during heat treatment of the measurement element (E1, . . . , En) or of a material which is used in the measurement element (E1, . . . , En), and which parameter (P) is set differently for each of the different measurement elements (E1, . . . , En),

combining the individual measurement elements (E1, . . . , En) to form an array (10) such that the entire array (10) is subjected to essentially only one temperature during the measurement of the operating temperature (T_M);

determining, in a first measurement, values of the physical parameter (P) for all the measurement elements (E1, . . . , En) in the array (10), before the array (10) is subjected to the operating temperature (T_M) to be measured;

subjecting the array (10), over a time period, to the operating temperature (T_M) to be measured in the device;

determining, in a second measurement, values of the physical parameter (P) for all the measurement elements (E1, . . . , En) in the array (10); and

comparing the values of the physical parameter (P) measured in the first and the second measurement for each of the measurement elements (E1, . . . , En) with one another and the temperature of the heat treatment (T_HT) of that measurement element whose value of the physical parameter (P) has changed the least in the two measurements is taken as the measured temperature.

2. The method as claimed in claim 1, wherein in the course of comparing the values from the first and the second measurement, the measured values of the physical parameter are subtracted from one another in pairs.

3. The method as claimed in claim 1 wherein, in order to set the different physical parameter (P) in the measurement elements (E1, . . . , En), the measurement elements (E1, . . . ,En) are each subjected to a heat treatment at a different temperature (T_HT).

4. The method as claimed in claim 3, wherein the different temperatures (T_HT) of the heat treatment are in a predetermined temperature range and are distributed uniformly over the predetermined temperature range.

5. An apparatus for carrying out passive determination of an operating temperature (T_M) in a thermally highly loaded device (12), the apparatus comprising a plurality of individual passive measurement elements (E1, . . . , En) which have at least one measurable physical parameter (P) that depends unambiguously on a constant temperature (T_HT) which is set during heat treatment of the measurement element (E1, . . . , En) or of a material which is used in the measurement element (E1, . . . , En), and which parameter (P) is set differently for the different measurement elements (E1, . . . , En), wherein the individual measurement elements (E1, . . . , En) are combined to form an array (10) such that the entire array (10) is subject to essentially only one temperature during the measurement of the operating temperature (T_M).

6. The apparatus as claimed in claim 5, wherein the measurement elements (E1, . . . , En) are solid bodies with a volume of a few mm³.