APPARATUS AND METHOD FOR DETERMINING THE COMPOSITION OF A MATERIAL BEING EXAMINED

• US 20090255829A1
• Filed: 04/14/2008
• Published: 10/15/2009
• Est. Priority Date: 04/14/2008
• Status: Active Grant

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Bizzotto, Dan, Tixier, Sebastien
• Granted Patent: US 8,105,475 B2
• Time in Patent Office: Days
• US Class Current: 205/775
• CPC Class Codes: G01N 27/48 using polarography, i.e. measuring changes in current under a slowly-varying voltage
• CPC Class Codes: G01N 33/46 Wood

Abstract

A method includes identifying first data associated with cyclic voltammetry measurements of a material being examined. The cyclic voltammetry measurements include applying a varying first voltage to the material and measuring a first current. The method also includes identifying second data associated with impedance measurements. The impedance measurements include applying a second voltage to the material and measuring a second current. The second data includes a scaling factor. The method further includes adjusting at least part of the first data using the scaling factor and identifying a composition of the material using the adjusted first data. The first data could include a current versus voltage curve that associates values of the first current to values of a sweep voltage. The first data could be adjusted by normalizing the curve using the scaling factor, and the normalized curve could be used to generate a current derivative curve.

Claims

1. A method comprising:

identifying first data associated with cyclic voltammetry measurements of a material being examined, the cyclic voltammetry measurements comprising applying a varying first voltage to the material and measuring a first current generated using the varying first voltage;

identifying second data associated with impedance measurements, the impedance measurements comprising applying a second voltage to the material and measuring a second current generated using the second voltage, the second data comprising a scaling factor;

adjusting at least part of the first data using the scaling factor; and

identifying a composition of the material using the adjusted first data.

2. The method of claim 1, wherein identifying the first data comprises:

applying a sweep voltage that varies over a range of voltages to the material being examined;

measuring the first current, the first current based on the sweep voltage; and

generating a current versus voltage curve that associates values of the first current to values of the sweep voltage.

3. The method of claim 2, wherein identifying the second data comprises:

applying a sinusoidal voltage at multiple frequencies to the material being examined;

measuring the second current, the second current based on the sinusoidal voltage; and

generating the scaling factor using measurements of the second current.

4. The method of claim 3, wherein adjusting at least part of the first data comprises normalizing the current versus voltage curve using the scaling factor to produce a normalized current versus voltage curve.

5. The method of claim 4, further comprising:

generating a current derivative curve using the normalized current versus voltage curve, the current derivative curve associating changes in the first current against changes in the sweep voltage as identified in the normalized current versus voltage curve.

6. The method of claim 5, wherein identifying the composition of the material comprises using the current derivative curve.

7. The method of claim 1, wherein:

identifying the second data comprises identifying a conductivity of the material being examined; and

identifying the composition of the material comprises using the identified conductivity of the material.

8. The method of claim 1, wherein:

the cyclic voltammetry measurements comprise applying the first voltage across first and second electrodes of a sensor probe during multiple cycles; and

further comprising swapping the second electrode and a third electrode during the multiple cycles of the cyclic voltammetry measurements.

9. The method of claim 1, wherein the second voltage is applied at multiple frequencies and has a magnitude substantially less than the varying first voltage.

10. The method of claim 9, wherein:

the first voltage has a maximum value of at least 1.3V and a minimum value of at least −

0.7V;

the second voltage has a value of no more than 0.1V; and

the second voltage is applied at five or more frequencies, the five or more frequencies between 1 Hz and 100 kHz inclusive.

11. A system comprising:

a sensor probe configured to receive a material being examined, the sensor probe comprising a first electrode and a second electrode; and

a sensor controller configured to;

measure a first current that is based on a varying first voltage provided across the electrodes during cyclic voltammetry measurements;

measure a second current that is based on a second voltage provided across the electrodes during impedance measurements;

identify a scaling factor using measurements of the second current, the scaling factor associated with an effective surface area of the electrodes; and

identify a composition of the material being examined using measurements of the first current and the scaling factor.

12. The system of claim 11, wherein:

the sensor controller is configured to provide a sweep voltage across the electrodes as the varying first voltage, the sweep voltage varying over a range of voltages; and

the sensor controller is further configured to generate a current versus voltage curve that associates values of the first current to values of the sweep voltage.

13. The system of claim 12, wherein the sensor controller is configured to identify the composition of the material by normalizing the current versus voltage curve using the scaling factor to produce a normalized current versus voltage curve.

14. The system of claim 13, wherein:

the sensor controller is configured to identify the composition of the material further by generating a current derivative curve using the normalized current versus voltage curve; and

the current derivative curve associates changes in the first current against changes in the sweep voltage as identified in the normalized current versus voltage curve.

15. The system of claim 11, wherein:

the sensor controller is further configured to identify a conductivity of the material being examined using the second current and the second voltage; and

the sensor controller is configured to identify the composition of the material using the identified conductivity of the material.

16. An apparatus comprising:

an electrode controller configured to provide voltages across electrodes of a sensor probe;

a current monitor configured to measure currents flowing through at least one of the electrodes; and

a processor configured to;

receive measurements of a first current, the first current based on a varying first voltage provided across the electrodes of the sensor probe during cyclic voltammetry measurements;

receive measurements of a second current, the second current based on a second voltage provided across the electrodes of the sensor probe during impedance measurements; and

identify a scaling factor using measurements of the second current, the scaling factor based on a capacitance associated with the electrodes;

wherein the apparatus is configured to identify a composition of a material being examined using measurements of the first current and the scaling factor.

17. The apparatus of claim 16, further comprising:

an ion identification unit configured to identify the composition of the material being examined.

18. The apparatus of claim 16, wherein:

the electrode controller is configured to provide a sweep voltage across the electrodes as the first voltage, the sweep voltage varying over a range of voltages; and

the processor is further configured to generate a current versus voltage curve that associates values of the first current to values of the sweep voltage.

19. The apparatus of claim 18, wherein the processor is further configured to normalize the current versus voltage curve using the scaling factor to produce a normalized current versus voltage curve.

20. The apparatus of claim 19, wherein:

the processor is further configured to generate a current derivative curve using the normalized current versus voltage curve;

the current derivative curve associates changes in the first current against changes in the sweep voltage as identified in the normalized current versus voltage curve; and

the current derivative curve is used to identify the composition of the material.