PLASMA PROCESSING APPARATUS, PLASMA PROCESSING METHOD, AND TRAY
4 Assignments
0 Petitions
Accused Products
Abstract
A tray 15 for a dry etching apparatus 1 has substrate accommodation holes 19A to 19D penetrating thickness direction and a substrate support portion 21 supporting an outer peripheral edge portion of a lower surface 2a of a substrate 2. A dielectric plate 23 has a tray support surface 28 supporting a lower surface of the tray 15, substrate placement portions 29A through 29D inserted from a lower surface side of the tray 15 into the substrate accommodation holes 19A through 19D and having a substrate placement surface 31 at its upper end surface for placing the substrate 2. A dc voltage applying mechanism 43 applies a dc voltage to an electrostatic attraction electrode 40. A heat conduction gas supply mechanism 45 supplies a heat conduction gas between the substrate 2 and substrate placement surface 31. The substrate 2 can be retained on the substrate placement surface 31 with high degree of adhesion. This results in that the cooling efficiency of the substrate 2 is improved and processing is uniformed at the entire region of the substrate surface including the vicinity of the outer peripheral edge.
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Citations
41 Claims
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1-27. -27. (canceled)
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28. A plasma processing apparatus comprising:
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a depressurizeable chamber; a tray formed with a plurality of substrate accommodation holes penetrating through thickness thereof, provided with substrate support portion projects from a hole wall of each of the substrate accommodation holes and supports an outer peripheral edge portion of a lower surface of a substrate accommodated in each of the substrate accommodation holes, and being capable of being carried in and out with respect to the chamber; a dielectric member, arranged in the chamber, provided with a tray support portion for supporting a lower surface of the tray that supports the substrates carried into the chamber, a plurality of substrate placement portions that project upward from the tray support portion, are respectively inserted into the corresponding substrate accommodation hole from the lower surface side of the tray, and respectively have a substrate placement surface at upper end on which the lower surface of the substrate is placed, a distance from the lower surface of the tray to and upper surface of the substrate support portions being smaller than that from tray support portion to the substrate placement surfaces so that the lower surface of the substrates placed on the substrate placement surfaces are separated to the substrate support portions of the tray with gaps of predetermined amount; an electrostatic attraction electrode at least a portion of which is embedded in the substrate placement portion for electrostatically attracting the substrate to the substrate placement surface; a dc voltage applying mechanism for applying a dc voltage to the electrostatic attraction electrodes; and a heat conduction gas supply mechanism for supplying a heat conduction gas to a space formed between the substrates and the substrate placement surfaces. - View Dependent Claims (29, 30, 31, 32, 33, 34, 35, 36, 37)
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38. A plasma processing method comprising:
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providing a tray formed with a plurality of substrate accommodation holes that penetrate through thickness thereof, and provided with a substrate support portion that projects from a hole wall of each of the substrate accommodation holes; accommodating substrates in respective substrate accommodation holes of the tray, thereby an outer peripheral edge portion of a lower surface of each of the substrates being supported by the substrate support portions so that the lower surface of each of the substrates is exposed by each of the substrate accommodation hole viewed from a lower surface side of the tray; placing the tray with the plurality of substrates accommodated therein above a dielectric member accommodated in a depressurizeable chamber; moving down the tray toward the dielectric member so that the lower surface of the tray is supported by a tray support portion of the dielectric member and so that a plurality of substrate placement portions respectively projecting from the tray support portion enter the substrate accommodation holes from the lower surface side of the tray, thereby the lower surface of each of the substrate being placed on a substrate placement surface that is an upper end surface of each of the substrate placement portions, wherein a distance from the lower surface of the tray to and upper surface of the substrate support portions is smaller than that from tray support portion to the substrate placement surfaces so that the lower surface of the substrates placed on the substrate placement surfaces are separated to the substrate support portions of the tray with gaps of predetermined amount; electrostatically attracting each of the substrates to the substrate placement surfaces by applying a dc voltage to an electrostatic attraction electrode at least a portion of which is embedded in the substrate placement portion; and
;supplying a heat conduction gas to a space formed between the lower surfaces of the substrates and the substrate placement surfaces, thereby generating plasma in the chamber. - View Dependent Claims (39, 40, 41)
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Specification