BULK ACOUSTIC WAVE RESONATOR WITH CONTROLLED THICKNESS REGION HAVING CONTROLLED ELECTROMECHANICAL COUPLING

• US 20090267453A1
• Filed: 04/24/2008
• Published: 10/29/2009
• Est. Priority Date: 04/24/2008
• Status: Active Grant

• Current Assignee: Contria San LLC (Intellectual Ventures LLC)
• Original Assignee: Skyworks Solutions Incorporated
• Inventors: Barber, Bradley P., Carpenter, Craig E., Bi, Frank
• Granted Patent: US 7,602,102 B1
• Time in Patent Office: Days
• US Class Current: 310/322
• CPC Class Codes: H03H 3/02 for the manufacture of piezoelectric or electrostrictive resonators or networks H03H3/08 takes precedence
• CPC Class Codes: H03H 9/02118 of lateral leakage between adjacent resonators
• CPC Class Codes: H03H 9/0542 consisting of a lateral arrangement H03H9/0566 takes precedence
• CPC Class Codes: H03H 9/172 Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
• CPC Class Codes: Y10T 29/42 Piezoelectric device making

Abstract

According to an exemplary embodiment, a bulk acoustic wave (BAW) resonator includes a piezoelectric layer situated between upper and lower electrodes, where each of the upper and lower electrodes are a high density metal. The BAW resonator further includes a controlled thickness region including a low density metal segment, where the low density metal segment is situated adjacent to the piezoelectric layer, and where the controlled thickness region has controlled electromechanical coupling. The controlled thickness region can provide reduced electromechanical coupling into lateral modes. The low density metal segment can extend along the perimeter of the BAW resonator.

Claims

1. A bulk acoustic wave (BAW) resonator comprising:

a piezoelectric layer situated between upper and lower electrodes, said upper and lower electrodes each comprising a high density metal;

a controlled thickness region comprising a low density metal segment, said low density metal segment being situated adjacent to said piezoelectric layer;

wherein said controlled thickness region has a controlled electromechanical coupling.

2. The BAW resonator of claim 1, wherein said controlled thickness region provides reduced electromechanical coupling into lateral modes.

3. The BAW resonator of claim 1, wherein said low density metal segment is situated between said upper electrode and said piezoelectric layer.

4. The BAW resonator of claim 1, wherein said low density metal segment extends along a perimeter of said BAW resonator.

5. The BAW resonator of claim 3, wherein an edge of said upper electrode is self-aligned with an outside edge of said low density metal segment.

6. The BAW resonator of claim 3, wherein an edge of said upper electrode overlaps an outside edge of said low density metal segment.

7. The BAW resonator of claim 1, wherein said low density metal segment comprises a metal selected from the group consisting of aluminum and titanium.

8. A method of forming a BAW resonator, said method comprising:

forming a piezoelectric layer over a lower electrode of said BAW resonator;

forming a low density metal segment over said piezoelectric layer in a controlled thickness region of said BAW resonator, said controlled thickness region having a controlled electromechanical coupling;

forming an upper electrode of said BAW resonator over said low density metal segment, said upper electrode comprising a high density metal.

9. The method of claim 8, wherein said controlled thickness region provides reduced electromechanical coupling into lateral modes.

10. The method of claim 8, wherein said low density metal segment extends along a perimeter of said BAW resonator.

11. The method of claim 8, wherein said forming said upper electrode comprises forming an edge of said upper electrode concurrently with an outer edge of said low density metal segment.

12. The method of claim 8, wherein said upper electrode overlaps an outside edge of said low density metal segment.

13. The method of claim 8, wherein said low density metal segment comprises a metal selected from the group consisting of aluminum and titanium.

14. A bulk acoustic wave (BAW) resonator comprising:

a piezoelectric layer situated between upper and lower electrodes;

a controlled thickness region comprising a dielectric segment, said dielectric segment being situated in contact with said piezoelectric layer, said dielectric segment being confined within a perimeter of said piezoelectric layer;

wherein said controlled thickness region has a controlled electromechanical coupling.

15. The BAW resonator of claim 14, wherein said controlled thickness region provides reduced electromechanical coupling into lateral modes.

16. The BAW resonator of claim 14, wherein said dielectric segment is situated between said upper electrode and said piezoelectric layer.

17. The BAW resonator of claim 16, wherein an edge of said upper electrode is aligned with an outer edge of said dielectric segment.

18. The BAW resonator of claim 14, wherein said dielectric segment comprises a low-k dielectric material.

19. The BAW resonator of claim 18, wherein said low-k dielectric material is selected from the group consisting of porous silica, fluorinated amorphous carbon, fluoro-polymer, parylene, polyarylene ether, hydrogen silsesquioxane (HSQ), fluorinated silicon dioxide, and diamondlike carbon.

20. The BAW resonator of claim 14, wherein said dielectric segment is situated at an edge of said BAW resonator.