×

SYSTEM AND METHOD FOR INSPECTING SURFACES USING OPTICAL WAVELENGTH FILTERING

  • US 20090273788A1
  • Filed: 05/13/2009
  • Published: 11/05/2009
  • Est. Priority Date: 06/30/2004
  • Status: Active Grant
First Claim
Patent Images

1. A system for inspecting a surface, the system comprising:

  • at least one light generator positioned adjacent the surface, the light generator adapted to project a beam of light across the surface, the beam of light totaling at least 0.15 watts of intensity per inch of a width of the beam of light;

    at least one camera positioned adjacent the surface for receiving at least a portion of the light reflected from the surface and for generating at least one image representative of a profile of at least a portion of the surface, the camera comprising a bandpass filter adapted to pass a band of the beam of light projected by the light generator, the band corresponding to a dip in solar radiation; and

    at least one processor adapted to analyze the at least one image and determine one or more physical characteristics of the portion of the surface.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×