SYSTEM AND METHOD FOR INSPECTING SURFACES USING OPTICAL WAVELENGTH FILTERING
First Claim
1. A system for inspecting a surface, the system comprising:
- at least one light generator positioned adjacent the surface, the light generator adapted to project a beam of light across the surface, the beam of light totaling at least 0.15 watts of intensity per inch of a width of the beam of light;
at least one camera positioned adjacent the surface for receiving at least a portion of the light reflected from the surface and for generating at least one image representative of a profile of at least a portion of the surface, the camera comprising a bandpass filter adapted to pass a band of the beam of light projected by the light generator, the band corresponding to a dip in solar radiation; and
at least one processor adapted to analyze the at least one image and determine one or more physical characteristics of the portion of the surface.
2 Assignments
0 Petitions
Accused Products
Abstract
A system and method for daylight inspection of a surface, such as a railroad track, is disclosed. The disclosed system includes lasers, cameras, and a processor. The lasers are positioned adjacent the surface. The laser emits a beam of light across the surface at a combined intensity of at least 0.15 watts of intensity per inch of width of the surface, and the camera captures images of the surface having the beam of light emitted thereon. The camera includes a bandpass filter which passes only a band of light corresponding to a dip in solar radiation. The laser is selected to provide an emitted light beam which is more intense than the solar radiation at the dip. The processor formats the images so that they can be analyzed to determine various measurable aspects of the surface. The system and method includes one or more algorithms for determining these measurable aspects of the surface.
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Citations
23 Claims
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1. A system for inspecting a surface, the system comprising:
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at least one light generator positioned adjacent the surface, the light generator adapted to project a beam of light across the surface, the beam of light totaling at least 0.15 watts of intensity per inch of a width of the beam of light; at least one camera positioned adjacent the surface for receiving at least a portion of the light reflected from the surface and for generating at least one image representative of a profile of at least a portion of the surface, the camera comprising a bandpass filter adapted to pass a band of the beam of light projected by the light generator, the band corresponding to a dip in solar radiation; and at least one processor adapted to analyze the at least one image and determine one or more physical characteristics of the portion of the surface. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for inspecting a surface, the method comprising the steps of:
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(a) illuminating a light across the span of the surface, the light totaling a combined intensity of at least 0.15 watts of intensity per inch of a width of the light; (b) receiving at least a portion of the light reflected from the surface using one or more cameras, the one or more cameras comprising a bandpass filter adapted to pass only a band of the reflected light, the band corresponding to a dip in solar radiation; (c) generating at least one image representative of a profile of at least a potion of the surface; (d) analyzing the at least one image; (e) determining one or more physical characteristics of the portion of the surface; and (f) outputting the determined physical characteristics of the portion of the surface. - View Dependent Claims (12, 13, 14, 15, 16, 17)
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18. A method for inspecting a surface, the method comprising the steps of:
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(a) projecting a light onto the surface, the light having an intensity of at least 0.15 watts of intensity per inch of a width of the light; (b) receiving at least a portion of the light reflected from the surface into a receiver; (c) utilizing a bandpass filter of the receiver to pass a band of the reflected light which corresponds to a dip in solar radiation, wherein the reflected light is adapted to be more intense than the solar radiation at the dip; (d) utilizing the passed band of the reflected light to generate one or more images representative of a profile of at least a portion of the surface; (e) determining one or more characteristics of the portion of the surface; and (f) outputting the determined characteristics of the portion of the surface. - View Dependent Claims (19, 20, 21, 22, 23)
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Specification