METHOD AND APPARATUS FOR MANUFACTURING DEVICE
First Claim
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1. A method for manufacturing a device, comprising:
- (A) forming a first electrode layer on a substrate;
(B) forming a ferroelectric layer on the first electrode layer;
(C) forming a second electrode layer on the ferroelectric layer;
(D) forming a mask having a predetermined pattern on the second electrode layer;
(E) forming a memory element by selectively removing the first electrode layer, the ferroelectric layer, and the second electrode layer using the mask; and
(F) removing the mask, whereinat least, the processes (D) and (E), or the processes (E) and (F) are continuously performed under a reduced pressure.
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Abstract
A method for manufacturing a device, includes: (A) forming a first electrode layer on a substrate; (B) forming a ferroelectric layer on the first electrode layer; (C) forming a second electrode layer on the ferroelectric layer; (D) forming a mask having a predetermined pattern on the second electrode layer; (E) forming a memory element by selectively removing the first electrode layer, the ferroelectric layer, and the second electrode layer using the mask; and (F) removing the mask, where at least, the processes (D) and (E), or the processes (E) and (F) are continuously performed under a reduced pressure.
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9 Claims
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1. A method for manufacturing a device, comprising:
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(A) forming a first electrode layer on a substrate; (B) forming a ferroelectric layer on the first electrode layer; (C) forming a second electrode layer on the ferroelectric layer; (D) forming a mask having a predetermined pattern on the second electrode layer; (E) forming a memory element by selectively removing the first electrode layer, the ferroelectric layer, and the second electrode layer using the mask; and (F) removing the mask, wherein at least, the processes (D) and (E), or the processes (E) and (F) are continuously performed under a reduced pressure. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. An apparatus for manufacturing a device, comprising:
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a transfer chamber including a transfer mechanism transferring a substrate; a normal-temperature etching chamber coupled to the transfer chamber; a high-temperature etching chamber coupled to the transfer chamber; and one or more load lock chambers coupled to the transfer chamber, wherein the transfer mechanism continuously transfers the substrate between the normal-temperature etching chamber, the high-temperature etching chamber, and the load lock chamber under vacuum. - View Dependent Claims (9)
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Specification