System for electrochemically measuring an analyte in a sample material

• US 20090302873A1
• Filed: 08/21/2009
• Published: 12/10/2009
• Est. Priority Date: 09/05/2007
• Status: Abandoned Application

• Current Assignee: LifeScan Scotland Limited (Johnson & Johnson)
• Original Assignee: LifeScan Scotland Limited (Johnson & Johnson)
• Inventors: Baskeyfield, Damian Edward Haydon, Haggett, Barry, Andres, Roberto, Birch, Brian
• Application Number:
  US12/447,475
• Publication Number:
  US 20090302873A1
• Time in Patent Office: Days
• US Class Current: 324/724
• CPC Class Codes: G01N 27/3272 Test elements therefor, i.e. disposable laminated substrates with electrodes, reagent and channels optical biosensors G01N33/52
• CPC Class Codes: Y10T 29/49117 Conductor or circuit manufacturing

Abstract

Strips, particularly test strips and adapters for test strips, for use in meters for the electrochemical measurement of analyte in a sample material and in particular the glucose concentration of a sample of blood. The strips comprise a plurality of working connectors, for interfacing with the meter, coupled to one or more working electrodes. The strips are of particular use in adapting multi-input meters for single input use.

Claims

1-67. -67. (canceled)

68. A system for electrochemically measuring an analyte in a sample material, the system comprising:

a strip comprising;

a reference electrode and a working electrode;

a reference connector, a first working connector, and second working connector for interfacing the strip to the measuring device;

a reference link configured to electrically couple the reference electrode to the reference connector;

a first working link configured to electrically couple the working electrode to the first working connector, and

a second working link configured to electrically couple to the working electrode to the second working connector, and

a meter comprising;

a first test voltage circuit capable of applying a first test voltage between the first working connector and the reference connector;

a second test voltage circuit capable of applying a second test voltage between the second working connector and the reference connector;

a current measurement circuit capable of measuring a first test current between the first working connector and the reference connector and a second test current between the second connector and the reference connector.

69. The system of claim 68, wherein the first working connector and the second working connector are electrically coupled to form a shunt resistance,

70. The system of claim 69, wherein:

a shunt current flows between the first working connector and the second working connector, and

said shunt resistance is configured to cause the shunt current to be less than a pre-determined threshold.

71. The system of claim 68, wherein the shunt current is less than 100 nA.

72. The system of claim 68, wherein a resistance of the first working link is configured so that a voltage drop between the first working connector and the working electrode is less than 20% of the first test voltage.

73. (canceled)

74. An adapter comprising:

a substrate;

at least three electrical connectors disposed on the substrate; and

two electrodes coupled to the at least three electrical connectors and capable of electrically coupling with respective two electrical connectors of a test strip.

75. A test strip system comprising:

an adapter having

a first substrate;

at least three electrical connectors disposed on the substrate; and

two linking electrodes disposed on the substrate, one of the linking electrodes being coupled to one of the at least three connectors and the other linking electrode being coupled to at least two connectors of the at least three connectors;

a test strip having

a second substrate;

two electrodes disposed on the second substrate; and

two connectors disposed on the second substrate, each of the two connectors capable of electrical coupling to the respective linking electrodes of the adapter.

76. (canceled)