PHOTOELECTROCHEMICAL ROUGHENING OF P-SIDE-UP GaN-BASED LIGHT EMITTING DIODES

• US 20090315055A1
• Filed: 05/12/2009
• Published: 12/24/2009
• Est. Priority Date: 05/12/2008
• Status: Abandoned Application

• Current Assignee: Regents of the University of California (University of California)
• Original Assignee: Regents of the University of California (University of California)
• Inventors: Hu, Evelyn Lynn, Tamboli, Adele, DenBaars, Steven P., Nakamura, Shuji
• Application Number:
  US12/464,711
• Publication Number:
  US 20090315055A1
• Time in Patent Office: Days
• US Class Current: 257/98
• CPC Class Codes: H01L 33/22 Roughened surfaces, e.g. at the interface between epitaxial layers
• CPC Class Codes: H01L 33/32 containing nitrogen

Abstract

A method for photoelectrochemical (PEC) etching of a p-type gallium nitride (GaN) layer of a heterostructure, comprising using an internal bias in a semiconductor structure to prevent electrons from reaching a surface of the p-type layer, and to promote holes reaching the surface of the p-type layer, wherein the semiconductor structure includes the p-type layer, an active layer for absorbing PEC illumination, and an n-type layer.

Claims

1. A light emitting diode (LED), comprising:

(a) a p-type III-nitride layer having a surface which is roughened for extracting light emitted by the LED;

(b) an n-type III-nitride layer; and

(c) an active layer for emitting the light, between the p-type III-nitride layer and the n-type III-nitride layers.

2. The LED of claim 1, wherein the p-type III-nitride layer, n-type III-nitride layer and active layer have no ion damage introduced by a roughening process of the surface.

3. The LED of claim 1, wherein material qualities of the p-type III-nitride layer, n-type III-nitride layer and active layer are such that a current-voltage (I-V) measurement of the LED having the surface which is roughened is not substantially different, or degraded, as compared to an I-V measurement of the LED prior to the surface being roughened.

4. The LED of claim 1, wherein the surface is roughened to create features or structures so dimensioned to extract the light out of the p-type layer and the LED.

5. The LED of claim 4, wherein the surface is roughened to create features or structures so dimensioned to extract more of the light out of, or transmit more of the light through, the surface as compared to extraction out of, or transmission through, a surface of the p-type layer prior to the roughening or a surface without the features or structures.

6. The LED of claim 5, wherein the features or structures are so dimensioned to scatter, diffract, refract or direct the light out of the p-type layer and the LED.

7. The LED of claim 1, wherein the surface is roughened with features or structures that are so dimensioned as to cause at least 20% more light output power to be transmitted through the surface and exit the LED, as compared to a light output power that is transmitted through the surface prior to the roughening and without the structures.

8. The LED of claim 1, wherein the surface is roughened or structured with structures that are so dimensioned as to cause at least 20% more light output power to be transmitted through the surface and exit the LED, as compared to a light output power that is transmitted through a planar, flat, or smooth surface of the p-type layer that has a surface roughness of 1 nm or less.

9. The LED of claim 1, wherein the surface is roughened with features or structures having a side, dimension, width, height and separation so dimensioned as to scatter or diffract the light out of the p-type layer and the LED.

10. The LED of claim 1, wherein the surface is roughened with features or structures having a side, dimension, width, height and separation at least as long as a wavelength of the light in the p-type layer, in order to enhance scattering, diffraction, or transmission of the light out of the p-type layer and the LED.

11. The LED of claim 10, wherein the side, the dimension, the width, the height, and the separation are at least 0.3 μ

m.

12. The LED of claim 11, wherein the side, the dimension, the height, and the separation are at most 2 μ

m.

13. The LED of claim 11, wherein the side, the dimension, the height, and the separation are at most 10 μ

m.

14. The LED of claim 1, wherein the surface is shaped so that light from the active layer impinges on the surface within a critical angle for refraction out of the p-type layer and into an external medium.

15. The LED of claim 1, wherein the surface comprises one or more inclined surfaces so dimensioned that the light impinges on the inclined surfaces within the critical angle, thereby substantially preventing total internal reflection of the light at the inclined surfaces.

16. The LED of claim 15, wherein the inclined surfaces are inclined at the critical angle so that the light impinges on the inclined surfaces within the critical angle and more than 4-6% of the light from the active layer is extracted from the surface.

17. The LED of claim 1, wherein the surface comprises a surface roughness of 25 nm or greater.

18. The LED of claim 1, wherein the roughening is formed on an N-face, Ga-face, nonpolar surface, or semipolar surface of the p-type layer.

19. A method for fabricating a III-nitride based light emitting diode (LED), comprising:

roughening a p-type surface of the III-nitride based light emitting LED, wherein the roughening comprises photoelectrochemically etching the p-type surface and the roughening is suitable to extract light from the LED.

20. A light emitting diode (LED), comprising a roughened surface of a p-type layer, wherein the roughened surface scatters light incident on the roughened surface into an external medium, wherein the light is incident from a light-emitting active layer of the LED.

21. The LED of claim 20, wherein the LED is III-nitride based and the p-type layer is a III-Nitride.

22. A method for extracting light from a light emitting diode, comprising extracting the light from a roughened surface of a p-type III-nitride layer.