LOW COST CURRENT AND TEMPERATURE SENSOR

• US 20090315564A1
• Filed: 04/24/2008
• Published: 12/24/2009
• Est. Priority Date: 04/24/2008
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Honeywell International Inc.
• Inventors: VEGA, FERNANDO DE LA, CERNASOV, ANDREI, MAROTTA, JOSEPH
• Granted Patent: US 8,058,876 B2
• Time in Patent Office: Days
• US Class Current: 324/426
• CPC Class Codes: G01K 7/38 the variations of temperature influencing the magnetic permeability
• CPC Class Codes: G01R 15/202 using Hall-effect devices Hall elements in arrangements for measuring electrical power G01R21/08
• CPC Class Codes: G01R 15/207 Constructional details independent of the type of device used
• CPC Class Codes: G01R 31/382 Arrangements for monitoring battery or accumulator variables, e.g. SoC

Abstract

A battery health or prognosis system may employ a ferrite disc embedded in a printed wiring board (PWB) to perform both a battery current sensing role and a temperature sensing role. The ferrite disc may be surrounded with a coil that may be comprised of surface conductors and electrically conductive vias of the PWB. Excursions of coil current may be produced to generate observable hysterisis loops in the ferrite disc. The generated hysterisis loops may be compared to a temperature-dependent family of hysterisis loops for the magnetic material from which the ferrite disc is constructed. A processor mounted on the PWB may collect and process outputs from a Hall-effect sensor to develop both temperature and battery current information to produce a prognosis for the battery.

Claims

1. Apparatus for determining battery prognosis comprising:

a ferrite disc having an axial opening through which a current carrying conductor of the battery passes;

a Hall-effect sensor interposed within the ferrite disc;

a coil surrounding the disc;

a unit for varying current in the coil to produce observable variations in temperature-dependent magnetic properties of the disc; and

a processor for continually analyzing signals from the Hall-effect sensor to determine current in the conductor and to determine temperature as a function of variations in magnetic properties of the disc.

2. The apparatus of claim 1 further comprising:

a single printed wiring board (PWB); and

wherein the ferrite disc, the Hall-effect sensor, the coil, the unit for varying current and the processor are integrated on the single PWB.

3. The apparatus of claim 2 further wherein the ferrite disc is embedded within multiple layers of the PWB.

4. The apparatus of claim 2 wherein the coil comprises:

surface conductors printed on the PWB; and

electrically conductive vias interposed between the surface conductors.

5. The apparatus of claim 1 wherein the unit for varying current in the coil produces bias current in the coil.

6. The apparatus of claim 5:

wherein the bias current is a base bias current large enough to preclude saturation of the disc from current in the conductor of the battery;

wherein the unit for varying current in the coil also produces current excursions around the base bias current; and

wherein the current excursions produce the observable variations in magnetic properties of the disc.

7. The apparatus of claim 6 wherein an observable magnetic property of the disc comprises a hysterisis loop.

8. The apparatus of claim 1 wherein the ferrite disc has an initial permeability that is related to temperature in a non-linear relationship.

9. A battery condition detector comprising:

a PWB through which a conductor of the battery current passes;

a ferrite disc surrounding the conductor of the battery;

a coil surrounding the ferrite disc;

a coil-current unit for varying current in the coil;

a sensor producing an output that varies as function of the varying current in the coil;

a processor comprising stored reference data relating to temperature dependent magnetic properties of the ferrite disc;

the ferrite disc, the coil, the coil-current unit, the sensor and the processor being attached to the PWB;

the processor receiving varying output from the sensor responsive to the varying current in the coil; and

the processor comparing the varying output from the sensor with the stored reference data to determine a temperature of the ferrite disc.

10. The detector of claim 9 wherein the temperature of the ferrite disc corresponds to temperature of the battery.

11. The detector of claim 9 wherein output of the sensor also varies as function of current in the conductor of the battery.

12. The detector of claim 11 wherein the processor produces a prognosis of the battery as a function of current in the conductor and temperature of the battery.

13. The detector of claim 9 wherein the ferrite disc is embedded within multiple layers of the PWB.

14. The detector of claim 13 wherein the coil comprises surface conductors and vias of the PWB.

15. A method for producing a prognosis for a battery comprising the steps of:

passing current from the battery though an opening in a ferrite disc;

sensing magnetic reaction to the current from the battery;

varying current in a coil surrounding the ferrite disc;

sensing temperature-dependent magnetic reaction to the varying coil current;

comparing the sensed magnetic reaction to coil current with processor-stored magnetic property data for the ferrite disc to determine temperature of the ferrite disc; and

processing the determined temperature and the sensed magnetic reaction to battery current to produce a prognosis of the battery.

16. The method of claim 15 wherein the step of varying current in the coil comprises producing a current excursion that results in a hysterisis excursion in the ferrite disc.

17. The method of claim 16 wherein the step of varying current in the coil also comprises producing a base bias current that precludes saturation of the ferrite disc from the battery current.

18. The method of claim 17 wherein the current excursion comprises an excursion around the base bias current.

19. The method of claim 15 wherein the sensed magnetic reaction to coil current is a hysterisis loop.

20. The method of claim 19 wherein the processor-stored magnetic property data for the ferrite disc comprises a plurality of temperature-dependent hysterisis loops for the ferrite disc.