Analytical Instrument Having Internal Reference Channel

• US 20090323073A1
• Filed: 06/30/2008
• Published: 12/31/2009
• Est. Priority Date: 06/30/2008
• Status: Abandoned Application

• Current Assignee: Reichert, Inc. (Ametek Incorporated)
• Original Assignee: Reichert, Inc. (Ametek Incorporated)
• Inventors: Luber, Edward J., Hoover, Douglas H.
• Application Number:
  US12/164,183
• Publication Number:
  US 20090323073A1
• Time in Patent Office: Days
• US Class Current: 356/448
• CPC Class Codes: G01N 21/553 and using surface plasmons fluorescence excitation G01N21/648; enhanced Raman G01N21/658

Abstract

An analytical instrument for making measurements based on detection of an SPR resonance minimum or a refractometer transition shadowline on a detector array is improved by configuring a diaphragm of the instruments illumination system to include a first aperture, a second aperture, and an opaque region between the first and second apertures, wherein the opaque region of the diaphragm casts a shadow on the detector array to provide a reference minimum from which a relative location of the resonance minimum or transition shadowline is measurable. By establishing a reference minimum on the detector array as a reference location for relative measurement, the instrument compensates for signal drift and other instrument variations. The diaphragm may include additional apertures and opaque regions for generating additional reference minima over the extent of the detector array.

Claims

1. An analytical instrument comprising:

a measurement interface associated with a test sample;

an illumination system for illuminating the measurement interface with light having rays incident to the measurement interface over a range of illumination angles, the illumination system including at least one light source and a diaphragm between the at least one light source and the measurement interface; and

a detector array arranged to detect light coming from the measurement interface, the detector array including a plurality of photosensitive pixels each providing a signal indicative of light intensity received thereby;

wherein the diaphragm has a first aperture, a second aperture, and an opaque region between the first and second apertures, the opaque region casting a shadow on the detector array to provide a reference minimum in light intensity at a location on the detector array, the location of the reference minimum being subject to signal drift over time as a result of instrument use.

2. The analytical instrument according to claim 1, wherein the measurement interface is a surface plasmon resonance interface, and the detected light exhibits a resonance minimum

3. The analytical instrument according to claim 1, wherein the measurement interface is a critical angle refractometer interface, and the feature of the detected light is a transition shadowline between an illuminated region and a darkened region.

4. The analytical instrument according to claim 1, wherein the first aperture transmits rays incident to the measurement interface at angles within the range of illumination angles, and the second aperture transmits rays incident to the measurement interface at angles outside the range of illumination angles.

5. The analytical instrument according to claim 1, wherein the first aperture is shaped as an elongated slit and the second aperture is shorter in length than the first aperture.

6. The analytical instrument according to claim 5, wherein the second aperture is shaped as a circle.

7. The analytical instrument according to claim 5, wherein the second aperture is shaped as a rectangle.

8. The analytical instrument according to claim 1, further comprising at least one additional aperture and at least one additional opaque region between the second aperture and the at least one additional aperture, the at least one additional opaque region providing at least one additional reference minimum on the detector array.

9. The analytical instrument according to claim 8, wherein the at least one additional aperture includes a third aperture, and the first aperture is between the second aperture and the third aperture.

10. The analytical instrument according to claim 9, wherein the at least one additional aperture includes a fourth aperture, and the first aperture and second aperture are between the third aperture and the fourth aperture.

13. The method according to claim 11, wherein the feature related to the analytical measurement is a transition shadowline between an illuminated region and a darkened region resulting from a critical angle of total internal reflection at the measurement interface.

11. A method of compensating for signal drift in an analytical instrument having an illumination system for illuminating a measurement interface associated with a test sample, the method comprising the steps of:

configuring the illumination system to cast at least one shadow on a detector array arranged to detect light coming from the measurement interface, wherein the shadow is located between illuminated regions of the detector array, to provide at least one corresponding reference minimum on the detector array, a location of the reference minimum being subject to signal drift over time as a result of instrument use;

measuring the location of the at least one reference minimum on the detector array and a location of a feature of the detected light related to an analytical measurement; and

using the location of the at least one reference minimum to correct for signal drift error in the location of the feature related to the analytical measurement.

12. The method according to claim 11, wherein the feature related to the analytical measurement is a resonance minimum resulting from surface plasmon resonance at the measurement interface.

14. The method according to claim 11, wherein the at least one reference minimum includes a plurality of reference minima.

15. In an analytical instrument for making measurements based on detection of a resonance minimum on a detector array, the resonance minimum resulting from surface plasmon resonance at an illuminated measurement interface, the improvement comprising:

a diaphragm including a first aperture, a second aperture, and an opaque region between the first and second apertures, wherein the opaque region of the diaphragm casts a shadow on the detector array to provide a reference minimum.

16. The improvement according to claim 15, wherein the diaphragm includes at least one additional aperture separated from either the first aperture or the second aperture by an additional opaque region, wherein the additional opaque region of the diaphragm casts a shadow on the detector array to provide an additional reference minimum.

17. In an analytical instrument for making measurements based on detection of a transition shadowline on a detector array, the transition shadowline resulting from critical angle reflection at an illuminated measurement interface, the improvement comprising:

a diaphragm including a first aperture, a second aperture, and an opaque region between the first and second apertures, wherein the opaque region of the diaphragm casts a shadow on the detector array to provide a reference minimum.

18. The improvement according to claim 17, wherein the diaphragm includes at least one additional aperture separated from either the first aperture or the second aperture by an additional opaque region, wherein the additional opaque region of the diaphragm casts a shadow on the detector array to provide an additional reference minimum.