SURGICAL MICROSCOPY SYSTEM AND IMAGING METHOD
First Claim
Patent Images
1. A Surgical microscopy system, comprising:
- an illumination system for illuminating an object region with illumination light along an illumination beam path, andan optical imaging system for generating an image of the object region;
wherein the illumination system comprises;
a xenon gas discharge lamp for generating at least the illumination light; and
a spectral filter which is optionally positionable in the illumination beam path and removable from the same,wherein the spectral filter has a filter characteristics which, for a wavelength range between 400 nm and 700 nm, satisfies the relations;
f*(m*λ
+b−
Δ
b)≦
A(λ
)≦
f*(m*λ
+b+Δ
b);
0.0025/nm≦
m≦
0.0035/nm;
b=−
1.053;
f≦
1; and
Δ
b≦
0.3;
in particular Δ
b≦
0.15;
further in particular Δ
b≦
0.1,wherein it is set A(λ
)=0, if Δ
(λ
) is smaller than zero according to the above relations, wherein it is set A(λ
)=f, if A(λ
)≧
f according to the above relations, and wherein λ
represents a wavelength of the illumination light, and A(λ
) represents a ratio between an intensity of light emanating along the illumination beam path from the spectral filter and an intensity of light coming from the xenon gas discharge lamp being incident onto the spectral filter.
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Abstract
A surgical microscopy system having an illumination system is provided. The illumination system comprises a xenon gas discharge lamp and a spectral filter which is optionally positionable into an illumination beam path of the surgical microscopy system and removable from the same. The spectral filter substantially exhibits, in a wavelength range between 400 nm and 700 nm, a transmission increasing from about 0.12 to 1 having a gradient between 0.025/nm and 0.0035/nm, in particular 0.00293/nm. Thus, the illumination system is enabled to provide light having two different spectral characteristics which is advantageous in particular for imaging structures in the human eye scattering to a different degree.
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Citations
15 Claims
-
1. A Surgical microscopy system, comprising:
-
an illumination system for illuminating an object region with illumination light along an illumination beam path, and an optical imaging system for generating an image of the object region; wherein the illumination system comprises; a xenon gas discharge lamp for generating at least the illumination light; and a spectral filter which is optionally positionable in the illumination beam path and removable from the same, wherein the spectral filter has a filter characteristics which, for a wavelength range between 400 nm and 700 nm, satisfies the relations;
f*(m*λ
+b−
Δ
b)≦
A(λ
)≦
f*(m*λ
+b+Δ
b);0.0025/nm≦
m≦
0.0035/nm;b=−
1.053;f≦
1; andΔ
b≦
0.3;
in particular Δ
b≦
0.15;
further in particular Δ
b≦
0.1,wherein it is set A(λ
)=0, if Δ
(λ
) is smaller than zero according to the above relations, wherein it is set A(λ
)=f, if A(λ
)≧
f according to the above relations, and wherein λ
represents a wavelength of the illumination light, and A(λ
) represents a ratio between an intensity of light emanating along the illumination beam path from the spectral filter and an intensity of light coming from the xenon gas discharge lamp being incident onto the spectral filter.- View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 14)
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12. A method for imaging an object region, the method comprising:
-
illuminating the object region along an illumination beam path with illumination light, and imaging the object region; wherein light of a xenon gas discharge lamp is used as illumination light which is filtered by a spectral filter, wherein the spectral filter has a filter characteristics which, for a wavelength range between 400 nm and 700 nm satisfies the relations
f*(m*λ
+b−
Δ
b)≦
A(λ
)≦
f*(m*λ
+b+Δ
b);0.0025/nm≦
m≦
0.0035/nm;b=−
1.053;f≦
1; andΔ
b≦
0.3;
in particular Δ
b≦
0.15;
further in particular Δ
b≦
0.1,wherein it is set A(λ
)=0, if A(λ
) is smaller than zero according to the above relations, wherein it is set A(λ
)=f, if A(λ
)≧
f according to the above relations, andwherein λ
represents a wavelength of the illumination light, and A(λ
) represents a ratio between an intensity of light emanating along the illumination beam path from the spectral filter and an intensity of light coming from the xenon gas discharge lamp being incident onto the spectral filter. - View Dependent Claims (13, 15)
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Specification
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Current AssigneeCarl Zeiss Surgical GmbH (Carl-Zeiss-Stiftung)
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Original AssigneeCarl Zeiss Surgical GmbH (Carl-Zeiss-Stiftung)
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InventorsReimer, Peter, Andrews, Delbert Peter
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Granted Patent
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Time in Patent OfficeDays
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Field of Search
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US Class Current359/385
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CPC Class CodesG02B 21/025 with variable magnification...G02B 21/06 Means for illuminating spec...G02B 21/22 Stereoscopic arrangementsG02B 5/205 Neutral density filters
