Through-substrate vias and method of fabricating same

• US 20100001378A1
• Filed: 07/01/2008
• Published: 01/07/2010
• Est. Priority Date: 07/01/2008
• Status: Abandoned Application

• Current Assignee: Teledyne Scientific & Imaging, LLC (Teledyne Technologies Incorporated)
• Original Assignee: Teledyne Scientific & Imaging, LLC (Teledyne Technologies Incorporated)
• Inventors: DeNatale, Jeffrey F., Stupar, Philip A., Papavasiliou, Alexandros P.
• Application Number:
  US12/217,217
• Publication Number:
  US 20100001378A1
• Time in Patent Office: Days
• US Class Current: 257/621
• CPC Class Codes: H01L 21/76898 formed through a semiconductor substrate
• CPC Class Codes: H01L 23/481 Internal lead connections, e.g. via connections, feedthrough structures
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/00012 Relevant to the scope of the group, the symbol of which is combined with the symbol of this group
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

An through-substrate via fabrication method requires forming a through-substrate via hole in a semiconductor substrate, depositing an electrically insulating, continuous and substantially conformal isolation material onto the substrate and interior walls of the via using ALD, and depositing a conductive material into the via and over the isolation material using ALD such that it is electrically continuous across the length of the via hole. The isolation material may be prepared by activating it with a seed layer deposited by ALD. The via hole is preferably formed by dry etching first and second cavities having respective diameters into the substrate'"'"'s top and bottom surfaces, respectively, to form a single continuous aperture through the substrate. The present method may be practiced at temperatures of less than 200° C. The basic fabrication method may be extended to provide vias with multiple conductive layers, such as coaxial and triaxial vias.

Claims

1. A process for fabricating a through-substrate via in a semiconductor substrate which may contain active circuitry, the substrate having a first surface and a second surface, comprising:

forming a through-substrate via hole in a semiconductor substrate;

depositing an isolation material directly onto the substrate and onto the interior walls of said through-substrate via hole using atomic layer deposition (ALD) such that said isolation material is electrically insulating, continuous and substantially conformal; and

depositing conductive material into the via hole over said isolation material using ALD such that said conductive material is electrically continuous across the length of said via hole.

2. The process of claim 1, wherein said steps of forming the via hole, depositing the isolation material, and depositing the conductive material are performed in a low temperature range.

3. The process of claim 2, wherein said low temperature range is <

200°

C.

4. The process of claim 1, further comprising preparing said isolation material by activating it with a seed layer which reacts with said conductive material.

5. The process of claim 4, wherein said seed layer is deposited by ALD.

6. The process of claim 1, wherein the depth of said through-substrate via hole is greater than 100 μ

m.

7. The process of claim 1, wherein said through-substrate via hole is formed by:

dry etching a first cavity into said substrate'"'"'s first surface, said first cavity having a first diameter; and

dry etching a second cavity into said substrate'"'"'s second surface, said second cavity having a second diameter, wherein the first and second cavities form a single continuous aperture through the substrate.

8. The process of claim 7, wherein said first and second cavities extend to depths in the range of 20 μ

m-200 μ

m and 100 μ

m-350 μ

m, respectively.

9. The process of claim 7, wherein said first and second diameters are in the range of 2 μ

m-8 μ

m and 6 μ

m-25 μ

m, respectively,

10. The process of claim 7, wherein said first and second cavities are dry etched using a deep reactive ion etching (DRIE) process.

11. The process of claim 10, wherein said DRIE process is the Bosch process.

12. The process of claim 7, wherein said first surface contains active circuitry and said first cavity is etched so as to have a depth which extends below the depth of the active circuitry on said first surface.

13. The process of claim 1, wherein the conductive material is chosen from a group consisting of nickel, palladium, platinum, ruthenium, tungsten, iridium, copper or zinc oxide.

14. The process of claim 1, wherein said deposition of an isolation material by ALD comprises deposition of inorganic oxides capable of providing electrical insulation and conformal surface coatings.

15. The process of claim 14, wherein said isolation material is chosen from a group of metal oxides comprising the oxides of aluminum, titanium, tantalum, niobium, zirconium, hafnium, lanthanum, yttrium, cerium, silicon, scandium, chromium, and erbium.

16. The process of claim 1, further comprising:

depositing a second layer of isolation material over said conductive material using ALD such that said second layer of isolation material is electrically insulating, continuous and substantially conformal; and

depositing a second layer of conductive material over said second layer of isolation material using ALD such that said second layer of conductive material is electrically continuous across the length of said via hole;

such that said layers of isolation material and said layers of conductive material form a shielded or coaxial via through said substrate.

17. The process of claim 16, further comprising:

depositing a third layer of isolation material over said second layer of conductive material using ALD such that said third layer of isolation material is electrically insulating, continuous and substantially conformal; and

depositing a third layer of conductive material over said third layer of isolation material using ALD such that said third layer of conductive material is electrically continuous across the length of said via hole;

such that said layers of isolation material and said layers of conductive material form a triaxial via through said substrate.

18. The process of claim 17, wherein one of said conductive material layers serves as a shield layer, further comprising biasing said shield layer to compensate for said via'"'"'s capacitance.

19. The process of claim 16, further comprising depositing at least one dielectric layer between the depositions of said first and second conductive layers which provides an etch stop layer to permit patterning of said second conductive layer without exposing said first conductive layer.

20. The process of claim 1, further comprising filling any portion of said via hole not already filled by said isolation material and said conductive material with a metal.

21. The process of claim 20, wherein said via hole is filled with a metal using an electroless or an electrolytic plating process.

22. The process of claim 1, further comprising removing said isolation and conductive materials from areas of said substrate where they are not needed.

23. The process of claim 1, further comprising forming metallization on one or both of said first and second substrate surfaces to provide electrical connections to the conductive material layers of said through-substrate via.

24. A substrate having first and second surfaces, comprising:

a substantially cylindrical cavity formed into the first surface to a first depth and having a first diameter;

a substantially cylindrical cavity formed into the second surface to a second depth greater than said first depth and having a second diameter greater than or equal to said first diameter, said substantially cylindrical cavities forming a via hole through said substrate;

an isolation material deposited on said substrate and onto the interior walls of said via hole using atomic layer deposition (ALD) such that said isolation material is electrically insulating, continuous and substantially conformal; and

a conductive material deposited into the via hole over said isolation material using ALD such that said conductive material is electrically continuous across the length of said via hole, thereby forming a through-substrate via.

25. The substrate of claim 24, wherein said first diameter and said second diameter are substantially equal.

26. The substrate of claim 24, wherein said first diameter is less than said second diameter.

27. The substrate of claim 24, wherein said substrate is bonded together with a plurality of additional substrates to form a multi-layer stack of substrates.

28. The substrate of claim 27, wherein said bonding effects electrical interconnections between individual substrate layers.

29. The substrate of claim 24, further comprising circuitry on said substrate, said through-substrate via providing an electrical connection to said circuitry.

30. The substrate of claim 24, wherein said substrate has a thickness of greater than 50 μ

m.

31. The substrate of claim 24, further comprising:

a second layer of isolation material deposited over said conductive material using ALD such that said second layer of isolation material is electrically insulating, continuous and substantially conformal; and

a second layer of conductive material deposited over said second layer of isolation material using ALD such that said second layer of conductive material is electrically continuous across the length of said via hole;

such that said layers of isolation material and said layers of conductive material form a shielded or coaxial via through said substrate.

32. The substrate of claim 31, further comprising:

a third layer of isolation material deposited over said second layer of conductive material using ALD such that said third layer of isolation material is electrically insulating, continuous and substantially conformal; and

a third layer of conductive material deposited over said third layer of isolation material using ALD such that said third layer of conductive material is electrically continuous across the length of said via hole;

such that said layers of isolation material and said layers of conductive material form a triaxial via through said substrate.

33. The substrate of claim 32, wherein one of said conductive material layers serves as a shield layer, further comprising a voltage applied to said shield layer to compensate for said via'"'"'s capacitance.

34. The substrate of claim 31, further comprising at least one dielectric layer between said first and second conductive layers, said at least one dielectric layer arranged to provide an etch stop layer to permit patterning of said second conductive layer without exposing said first conductive layer.

35. The substrate of claim 34, wherein said at least one dielectric layer comprises at least one PECVD oxide layer.

36. The substrate of claim 24, further comprising metal which fills any portion of said via hole not filled by said isolation material and said conductive material.

37. The substrate of claim 24, wherein said first surface contains active circuitry and said first depth is such that the depth of said substantially cylindrical cavity formed in said first surface extends below the depth of said active circuitry.