LASER INTERFERENCE DEVICE FOR TOUCH SCREENS
First Claim
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1. A system comprising:
- a source (220, 222) of a wide beamwidth projection (203),an array of detectors (240),a beam splitter (225) that is configured to provide two projections (201, 202) of the wide beamwidth projection (203);
a first projection (201) that extends across a planar area, anda second projection (202) that extends across the array of detectors, anda detection system (250) that is configured to detect interferences caused by reflections of the first projection (201) onto the array of detectors (240), and to determine therefrom a presence of one or more objects (150) in the planar area.
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Abstract
A system and method for location determination by laser interference detection uses a wide beamwidth laser projection (301) across a planar area (300). A lens system (222) is used to provide the wide beamwidth projection, and a split-beam system (225) is used to correlate interference patterns to particular segments of the wide beamwidth projection. The reflected interference beams are detected on a detector array (240) that is configured to detect the undulations corresponding to objects within the wide beamwidth projection.
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Citations
20 Claims
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1. A system comprising:
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a source (220, 222) of a wide beamwidth projection (203), an array of detectors (240), a beam splitter (225) that is configured to provide two projections (201, 202) of the wide beamwidth projection (203); a first projection (201) that extends across a planar area, and a second projection (202) that extends across the array of detectors, and a detection system (250) that is configured to detect interferences caused by reflections of the first projection (201) onto the array of detectors (240), and to determine therefrom a presence of one or more objects (150) in the planar area. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method comprising:
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providing (220, 222) a wide beamwidth projection, splitting (225) the wide beamwidth projection to provide two projections; a first projection (201) that extends across a planar area, and a second projection (202) that extends across an array of detectors (240), detecting (240) interferences caused by reflections of the first projection onto the array of detectors, and determining (250) from the interferences a presence of one or more objects (150) in the planar area. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification