Defect Inspection Method and Apparatus

• US 20100004875A1
• Filed: 06/22/2009
• Published: 01/07/2010
• Est. Priority Date: 07/07/2008
• Status: Abandoned Application

• Current Assignee: Hitachi High-Technologies Corporation (Hitachi, Ltd.)
• Original Assignee: Hitachi High-Technologies Corporation (Hitachi, Ltd.)
• Inventors: Honda, Toshifumi, Hamamatsu, Akira, Urano, Yuta, Maeda, Shunji
• Application Number:
  US12/488,610
• Publication Number:
  US 20100004875A1
• Time in Patent Office: Days
• US Class Current: 702/40
• CPC Class Codes: G01N 2021/4711 Multiangle measurement
• CPC Class Codes: G01N 2021/887 the measurements made in two or more directions, angles, positions
• CPC Class Codes: G01N 21/4738 Diffuse reflection precedence is given to G01N21/55 - G01N21/57 if specular component is taken into consideration, e.g. also for testing fluids, fibrous materials
• CPC Class Codes: G01N 21/9501 Semiconductor wafers manufacturing processes per se of semiconductor devices implementing a measuring step H01L22/10

Abstract

In a detection step, light produced on a sample in plural directions are collectively detected using a plurality of detectors. Multidimensional features containing information about scattered light distributions are extracted based on a plurality of detector outputs obtained. The feature is compared with data in a scattered light distribution library thereby to determine the types and sizes of defects. In a feature extraction step, a feature outputted based on the magnitude of each of scattered light detected signals of scatterers already known in refractive index and shape, which are obtained in the detection step, is corrected, thereby realizing high precision determination.

Claims

1. A defect inspection apparatus comprising:

an illumination section for introducing light emitted from a light source onto a sample;

a detection section for detecting scattered light components scattered in plural directions different from one another, of scattered light from the sample by illumination of the illumination section and outputting a plurality of detected signals corresponding to the detected scattered light components;

a signal processing section for extracting multidimensional features corresponding to defects using the detected signals and comparing the multidimensional features and pre-stored scattered light distribution data thereby to determine the types and sizes of the defects; and

a display unit for displaying a result of determination by the signal processing section.

2. The defect inspection apparatus according to claim 1, wherein the signal processing section includes a defect determination unit for processing the detected signals thereby to determine the presence of the defects, and a feature extraction unit for outputting the multidimensional features corresponding to the defects determined by the defect determination unit.

3. The defect inspection apparatus according to claim 1, wherein the scattered light distribution data are selected from a scattered light distribution library corresponding to a set of scattered light distribution data about defects of a plurality of types and a plurality of sizes pre-stored in a storage unit of the signal processing section.

4. The defect inspection apparatus according to claim 1, wherein the detection section has a plurality of detectors for collectively detecting scattered light components scattered in plural directions different from one another, of scattered light from the sample.

5. The defect inspection apparatus according to claim 1, wherein the signal processing section corrects the multidimensional features using correction coefficients calculated in advance.

6. The defect inspection apparatus according to claim 5, wherein the correction coefficients are calculated by detecting scattered light of scatterers already known in refractive index and shape and comparing a feature calculated from acquired detected signal actually-measured values and a feature determined by simulation.

7. The defect inspection apparatus according to claim 1, wherein the display unit displays the detected number of defect types selected by a user or at least one of distributions on the sample.

8. A defect inspection apparatus comprising:

an illumination section for introducing light emitted from a light source onto a sample;

a detection section for detecting a plurality of scattered light components emitted in plural directions different from one another, of scattered light produced on the sample by illumination of an illumination optical unit in the illumination section and outputting a plurality of detected signals corresponding thereto;

a defect determination unit for processing the detected signals outputted from the detection section to determine the presence of defects;

a feature extraction unit for outputting multidimensional features corresponding to the defects determined at the defect determination unit, based on the detected signals;

a storage unit for holding a scattered light distribution library corresponding to a set of scattered light distribution data about defects of plural types and sizes;

a defect type/size determination unit for determining the types and sizes of defects by comparison between the feature and the scattered light distribution library; and

a display unit for displaying a result of classification and a result of size determination obtained at the defect type/size determination unit.

9. The defect inspection apparatus according to claim 8, wherein a detection optical unit in the detection section collectively detects defect scattered light scattered in plural directions using a plurality of detectors.

10. The defect inspection apparatus according to claim 8, wherein the detection optical unit corrects each of the feature outputted from the feature extraction unit, based on the magnitude of each of signals obtained by detecting scattered light of scatterers already known in refractive index and shape.

11. The defect inspection apparatus according to claim 8, wherein the storage unit corrects each of the scattered light distribution data, based on the magnitude of each of scattered light detected signals of the scatterers already known in refractive index and shape, which are obtained at the detection optical unit, the material of a film of a substrate surface or the thickness of the film of the substrate surface.

12. The defect inspection apparatus according to claim 8, further including an input unit capable of inputting each defect type intended for detection by a user,

wherein the display unit displays the detected number of only defect types each designated as the defect type intended for the detection, of those determined to be defective at the defect determination unit, or a distribution on each object to be inspected.

13. The defect inspection apparatus according to claim 8, further including an input unit capable of inputting each defect type intended for non-detection by a user,

wherein the display unit displays the detected number of defect types excepting defect type each designated as the defect type intended for the non-detection, of those determined to be defective at the defect determination unit, or a distribution on each object to be inspected.

14. The defect inspection apparatus according to claim 12, wherein the display unit displays a typical diagram of a shape of each of defects each belonging to the defect type designated at the input unit, an enlarged image thereof by an electron microscope or the like, a scattered light distribution thereof or a feature corresponding to the scattered light distribution.

15. A defect inspection method comprising the steps:

an illumination step for introducing light emitted from a light source onto a sample;

a detection step for detecting a plurality of scattered light components emitted in plural directions different from one another, of scattered light produced on the sample in the illumination step and outputting a plurality of detected signals corresponding thereto;

a defect determination step for processing the detected signals obtained in the detection step to determine the presence of defects;

a feature extraction step for outputting multidimensional features corresponding to the defects determined in the defect determination step, based on the detected signals;

a defect type/size determination step for determining the types and sizes of the defects by comparison between a scattered light distribution library corresponding to a set of scattered light distribution data about defects of a plurality of types and a plurality of sizes held in advance and the feature; and

a display step for displaying a result of classification and a result of size determination obtained in the defect type/size determination step.

16. The defect inspection method according to claim 15, wherein in the detection step, defect scattered light scattered in plural directions are collectively detected.

17. The defect inspection method according to claim 15, wherein each feature outputted in the feature extraction step is corrected based on the magnitude of each of detected signals obtained by detecting scattered light of scatterers already known in refractive index and shape in the detection step.

18. The defect inspection method according to claim 15, wherein in a storage step after the steps above, each of the scattered light distribution data is corrected based on the magnitude of each of scattered light detected signals of the scatterers already known in refractive index and shape, which are obtained in the detection step, the material of a film of a substrate surface or the thickness of the film of the substrate surface.

19. The defect inspection method according to claim 15, further including an input step for enabling a user to input each defect type intended for detection,

wherein in the display step, the detected number of only defect types each designated as the defect type intended for the detection, of those determined to be defective in the defect determination step, or a distribution on each object to be inspected is displayed.

20. The defect inspection method according to claim 15, further including an input step for enabling a user to input each defect type intended for non-detection,

wherein in the display step, the detected number of defect types excepting defect types each designated as the defect type intended for the non-detection, of those determined to be defective in the defect determination step, or a distribution on each object to be inspected is displayed.