CRASH SENSOR AND METHOD FOR PROCESSING AT LEAST ONE MEASURING SIGNAL

• US 20100010778A1
• Filed: 09/06/2007
• Published: 01/14/2010
• Est. Priority Date: 10/09/2006
• Status: Active Grant

• Current Assignee: Robert Bosch GmbH
• Original Assignee: Robert Bosch GmbH
• Inventors: Schruellkamp, Michael
• Granted Patent: US 8,326,581 B2
• Time in Patent Office: Days
• US Class Current: 702/189
• CPC Class Codes: B60R 21/01332 by frequency or waveform analysis
• CPC Class Codes: B60R 21/0134 responsive to imminent contact with an obstacle , e.g. using radar systems
• CPC Class Codes: G01D 3/022 having an ideal characteristic, map or correction data stored in a digital memory
• CPC Class Codes: G01D 3/08 with provision for safeguarding the apparatus, e.g. against abnormal operation, against breakdown

Abstract

In a crash sensor and a method for processing a measured value of the crash sensor, at least one measured quantity is detected by a sensor element and a first rewritable memory is provided in which first data for influencing the processing of the at least one measured quantity are stored. In addition, a second hardwired memory is provided in which second data for influencing the processing are stored. A logic module is provided which loads the first or second data, as a function of a test of the first memory, for processing the at least one measured quantity.

Claims

1-10. -10. (canceled)

11. A crash sensor, comprising:

a sensor element adapted to detect at least one measured quantity;

a first, rewritable memory storing first data for influencing a processing of the at least one measured quantity;

a second memory storing second data for influencing the processing in a hard-wired manner; and

a logic module adapted to which load at least one of (a) the first and (b) the second data, as a function of a test of the first memory, for processing the at least one measured quantity.

12. The crash sensor according to claim 11, wherein the logic module is configured to perform the test using a check sum.

13. The crash sensor according to claim 11, wherein the logic circuit is adapted to influence an amplification for the at least one measured quantity and at least one reference voltage as a function of at least one of (a) the first and (b) the second data.

14. The crash sensor according to claim 11, wherein the crash sensor has a rapid offset regulation for eliminating an offset of the sensor element and a slow offset regulation for eliminating a drift, the logic module being configured to use the rapid offset regulation in an initial phase and the slow offset regulation in a cyclic phase.

15. The crash sensor according to claim 11, wherein the crash sensor has an interface over which the crash sensor sends a test result.

16. A method for processing at least one measured quantity of a crash sensor, comprising

detecting the at least one measured quantity;

testing a first, rewritable memory;

loading at least one of (a) first and (b) second data as a function of the test, the first data being stored in the first memory and the second data being stored in a hardwired manner in a second memory; and

influencing the processing by at least one of (a) the first and (b) the second data.

17. The method according to claim 16, wherein the test is performed using a check sum.

18. The method according to claim 16, wherein an amplification for the at least one measured quantity and at least one reference voltage is influenced as a function of at least one of (a) the first and (b) the second data.

19. The method according to claim 16, wherein a transmission of the processed at least one measured value is suppressed for a predefined period of time if the test indicates an error in a cyclic phase.

20. The method according to claim 16, wherein a rapid offset regulation for eliminating an offset of a sensor element is used in an initial phase, and a slow offset regulation for eliminating the drift is used in a cyclic phase.