Measurements of Optical Inhomogeneity and Other Properties in Substances Using Propagation Modes of Light

• US 20100014093A1
• Filed: 09/29/2009
• Published: 01/21/2010
• Est. Priority Date: 06/04/2003
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Tomophase Corporation
• Inventors: Wang, Feiling
• Granted Patent: US 7,999,938 B2
• Time in Patent Office: Days
• US Class Current: 356/479
• CPC Class Codes: A61B 2562/0242 for varying or adjusting the optical path length in the tissue
• CPC Class Codes: A61B 5/0059 using light, e.g. diagnosis by transillumination, diascopy, fluorescence A61B5/0093, A61B5/1455, A61B5/02416 and A61B5/0261 take precedence
• CPC Class Codes: A61B 5/0066 Optical coherence imaging
• CPC Class Codes: A61B 5/0073 by tomography, i.e. reconstruction of 3D images from 2D projections A61B5/0066 takes precedence
• CPC Class Codes: A61B 5/14532 for measuring glucose, e.g. by tissue impedance measurement
• CPC Class Codes: A61B 5/1455 using optical sensors, e.g. spectral photometrical oximeters
• CPC Class Codes: A61B 5/14558 by polarisation
• CPC Class Codes: G01B 2290/35 Mechanical variable delay line
• CPC Class Codes: G01B 2290/40 Non-mechanical variable delay line
• CPC Class Codes: G01B 2290/45 Multiple detectors for detecting interferometer signals
• CPC Class Codes: G01B 2290/70 Using polarization in the interferometer
• CPC Class Codes: G01B 9/0201 using temporal phase variation
• CPC Class Codes: G01B 9/02044 Imaging in the frequency domain, e.g. by using a spectrometer
• CPC Class Codes: G01B 9/02057 by using common path configuration, i.e. reference and object path almost entirely overlapping
• CPC Class Codes: G01B 9/02091 Tomographic interferometers, e.g. based on optical coherence
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/021 using plane or convex mirrors, parallel phase plates, or particular reflectors
• CPC Class Codes: G01J 3/0218 using optical fibers
• CPC Class Codes: G01J 3/0224 using polarising or depolarising elements
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08
• CPC Class Codes: G01N 2021/4709 : Backscatter
• CPC Class Codes: G01N 2021/4792 : Polarisation of scatter light
• CPC Class Codes: G01N 21/21 : Polarisation-affecting properties G01N21/19 takes precedence
• CPC Class Codes: G01N 21/27 : using photo-electric detection G01N21/31 takes precedence; circuits for computing concentration logarithmic circuits G06G7/24; photometric circuits in general G01J
• CPC Class Codes: G01N 21/474 : Details of optical heads therefor, e.g. using optical fibres
• CPC Class Codes: G01N 21/4795 : spatially resolved investigating of object in scattering medium in vivo A61B
• CPC Class Codes: G01N 21/49 : within a body or fluid
• CPC Class Codes: G01N 21/55 : Specular reflectivity
• CPC Class Codes: G02B 21/06 : Means for illuminating specimens

Abstract

This application describes designs, implementations, and techniques for controlling propagation mode or modes of light in a common optical path, which may include one or more waveguides, to sense a sample.

Claims

1-161. -161. (canceled)

162. A device for optically measuring a sample, comprising:

a waveguide, which supports at least an input propagation mode of light and comprises means for guiding an input beam in the input propagation mode;

a probe head coupled to the waveguide to receive the input beam and comprising means for reflecting a first portion of the input beam back to the waveguide in the input propagation mode, means for directing a second portion of the input beam in the input propagation mode to a sample, means for collecting reflection of the second portion from the sample, and means for exporting to the waveguide the reflection as a reflected second portion in the input propagation mode; and

a detection module comprising means for receiving the reflected first portion and the reflected second portion in the input propagation mode from the waveguide and means for extracting information of the sample carried by the reflected second portion.

163. A device for optically measuring a sample, comprising:

means for directing probe light via an optical waveguide in an input propagation mode to a vicinity of a sample under measurement;

means for directing a first portion of the probe light to propagate away from the sample at the vicinity of the sample without reaching the sample back into the optical waveguide while maintaining the first portion of the probe light in the input propagation mode;

means for directing a second portion of the probe light in the input propagation mode to the sample;

means for directing reflected light from the sample caused by illumination of the second portion to propagate in the input propagation mode to overlap with the first portion at a location where the first portion is generated and to co-propagate with the first portion along the optical waveguide beginning at the location; and

means for processing the reflected light from the sample and the first portion that co-propagate in the optical waveguide to obtain measurements of the sample at different depths that are reached by the second portion.

164. A device for optically measuring a sample, comprising:

means for directing one beam of guided light in a first propagation mode to a sample;

means for directing a first portion of the guided light in the first propagation mode at a location near the sample away from the sample before the first portion reaches the sample while allowing a second portion in the first propagation mode to reach the sample;

means for controlling a reflection of the second portion from the sample to be in a second propagation mode different from the first propagation mode to produce a reflected second portion; and

means for directing both the reflected first portion in the first propagation mode and the reflected second portion in the second propagation mode through a common waveguide into a detection module to extract information from the reflected second portion on the sample.