CALIBRATION METHOD AND APPARATUS
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Accused Products
Abstract
A method is described for calibrating apparatus comprising a measurement probe (4) mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data (x,y,z;70;80) indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data (a,b,c;72;82) indicative of the position of a surface relative to the measurement probe (4). The measurement probe (4) may be an analogue or scanning probe having a deflectable stylus (14). The first step of the method involves moving the measurement probe (4) at a known speed relative to an artefact (30;40,42) whilst capturing probe data (a,b,c;72;82) and machine position data (x,y,z;70;80). In particular, the measurement probe (4) is moved along a path that enables probe data (a,b,c;72;82) to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe (4). A second step of the method comprises analysing the machine position data (x,y,z;70;80) and the probe data (a,b,c;72;82) and determining from that data the relative delay in capturing probe data and machine position data (i.e. the so-called system delay).
53 Citations
49 Claims
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1-28. -28. (canceled)
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29. A method for calibrating apparatus comprising a measurement probe mounted on a machine, the machine being arranged to capture machine position data indicative of the position of the measurement probe relative to an artefact, the measurement probe being arranged to capture probe data indicative of the position of a surface relative to the measurement probe, the method comprising the steps of;
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(i) moving the measurement probe at a known speed relative to the artefact whilst capturing probe data and machine position data, the measurement probe being moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe; and (ii) analysing the machine position data and the probe data captured during step (i) and determining therefrom the relative delay in capturing probe data and machine position data. - View Dependent Claims (30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47)
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48. Apparatus comprising;
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a measurement probe for capturing probe data indicative of the position of a surface relative to the measurement probe; a machine for capturing machine position data indicative of the position of the measurement probe relative to an artefact located within the working area of the machine; a controller comprising calibration means for moving the measurement probe at a known speed relative to the artefact whilst capturing probe data and machine position data, the calibration means moving the measurement probe along a path that enables the capture of probe data indicative of the position of two or more points on the surface of the artefact relative to the measurement probe; wherein the controller comprises an analyser for determining the relative delay between the captured probe data and machine position data.
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49. A method of calibrating apparatus comprising a measurement probe mounted on a machine, the machine being arranged to capture machine position data indicative of the position of the measurement probe relative to an artefact, the measurement probe being arranged to capture probe data indicative of the position of a surface relative to the measurement probe, the method comprising the steps of;
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(i) moving the measurement probe at a known speed relative to the artefact whilst capturing probe data and machine position data, the measurement probe being moved along a path that enables the capture of probe data indicative of the position of at least one point on the surface of the artefact relative to the measurement probe, the path also including at least one change in the direction of probe movement that can be identified from the machine position data and the probe data; and (ii) comparing the machine position data and probe data captured during the scan of step (i) and determining therefrom the relative time delay in capturing machine position data and probe data.
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Specification