FORMATION FLUID SAMPLING APPARATUS AND METHODS

• US 20100018704A1
• Filed: 09/11/2009
• Published: 01/28/2010
• Est. Priority Date: 12/27/2006
• Status: Active Grant

• Current Assignee: Alexander F. Zazovsky, Colin Longfield, John D. Sherwood, Julian J. Pop, Keith A. Burgess, Thomas H. Zimmerman
• Original Assignee: Alexander F. Zazovsky, Colin Longfield, John D. Sherwood, Julian J. Pop, Keith A. Burgess, Thomas H. Zimmerman
• Inventors: ZAZOVSKY, ALEXANDER F., Zimmerman, Thomas H., Pop, Julian J., Longfield, Colin, Burgess, Keith A., Sherwood, John D.
• Granted Patent: US 7,841,406 B2
• Time in Patent Office: Days
• US Class Current: 166/264
• CPC Class Codes: E21B 49/10 using side-wall fluid samplers or testers

Abstract

A fluid sampling system retrieves a formation fluid sample from a formation surrounding a wellbore extending along a wellbore axis, wherein the formation has a virgin fluid and a contaminated fluid therein. The system includes a sample inlet, a first guard inlet positioned adjacent to the sample inlet and spaced from the sample inlet in a first direction along the wellbore axis, and a second guard inlet positioned adjacent to the sample inlet and spaced from the sample inlet in a second, opposite direction along the wellbore axis. At least one cleanup flowline is fluidly connected to the first and second guard inlets for passing contaminated fluid, and an evaluation flowline is fluidly connected to the sample inlet for collecting virgin fluid.

Claims

1. A downhole tool configured to be conveyed in a wellbore penetrating a subterranean formation, comprising:

an inlet extension mechanism; and

a probe assembly pivotably coupled to the inlet extension mechanism and comprising;

a sample inlet comprising;

a first profile dimension in a direction parallel to an axis of the wellbore; and

a second profile dimension in a direction perpendicular to the wellbore axis, in which the first profile dimension is greater than the second profile dimension;

an inner packer completely surrounding an outer periphery of the sample inlet;

a guard inlet extending completely around an outer periphery of the inner packer; and

an outer packer completely surrounding an outer periphery of the guard inlet.