THERMAL ACTUATOR FOR AN INFRARED SENSOR

• US 20100020383A1
• Filed: 07/28/2008
• Published: 01/28/2010
• Est. Priority Date: 07/28/2008
• Status: Active Grant

• Current Assignee: Alcatel-Lucent USA, Inc. (Nokia Corporation)
• Original Assignee: Lucent Technologies, Inc. (Nokia Corporation)
• Inventors: Greywall, Dennis S.
• Granted Patent: US 7,842,923 B2
• Time in Patent Office: Days
• US Class Current: 359/290
• CPC Class Codes: G02B 26/0841 the reflecting element being moved or deformed by electrostatic means

Abstract

In one embodiment, an infrared (IR) sensor has a flexible beam connected between two anchors supported on a substrate. The beam is mechanically coupled to a plate that has an IR-absorbing layer and is adapted to transfer the IR-induced heat to the beam. The heat transfer causes the beam to deform and move the plate with respect to the substrate. The motion of the plate is detected electrically or optically to quantify the amount of IR radiation received by the plate. The beam, anchors, and plate are formed from a planar layer of material that is supported at a specified offset distance from the substrate. During fabrication, certain portions of the planar layer are removed to define the beam, anchors, and plate.

Claims

1. A device, comprising:

a substrate;

a first flexible beam connected between two anchors supported on the substrate; and

a plate mechanically coupled to the first flexible beam and adapted to absorb incident radiation, wherein;

the plate is adapted to transfer heat generated due to said absorption to the first flexible beam to cause the first flexible beam to deform and move the plate with respect to the substrate; and

the first flexible beam and at least a portion of each of the two anchors have been formed from a common layer of material.

2. The invention of claim 1, wherein the incident radiation comprises infrared radiation.

3. The invention of claim 1, wherein at least a portion of the plate has been formed from said common layer of material.

4. The invention of claim 1, wherein:

said common layer of material is a planar layer supported at an offset distance from the substrate; and

certain portions of said planar layer have been removed to define the first flexible beam and the corresponding portions of the two anchors.

5. The invention of claim 4, wherein:

a slot cut through said common layer defines a side of the first flexible beam and a side of a fastener that mechanically connects said two anchors; and

a temperature difference between the first flexible beam and the fastener causes the first flexible beam to deform.

6. The invention of claim 1, further comprising a stationary electrode disposed on the substrate, wherein:

the stationary electrode and the plate form a capacitor; and

the motion of the plate produces a capacitance change for said capacitor indicative of an amount of incident radiation absorbed by the plate.

7. The invention of claim 1, further comprising a second flexible beam connected between two additional anchors supported on the substrate, wherein:

the plate is mechanically coupled to the second beam and is adapted to transfer a portion of the heat to the second beam to cause the second beam to deform; and

said motion of the plate is translation with respect to the substrate.

8. The invention of claim 7, wherein the second beam and at least a portion of each of the two additional anchors have been formed from said common layer of material.

9. The invention of claim 1, wherein said motion of the plate is rotation with respect to the substrate.

10. The invention of claim 9, further comprising:

a torsion rod affixed to the substrate; and

an extension of the plate that mechanically couples the plate to the torsion rod, wherein the first flexible beam is mechanically coupled to the extension so that the deformation of the first flexible beam causes the extension and the plate to rotate about a rotation axis defined by the torsion rod.

11. The invention of claim 1, wherein the first flexible beam has a length that is greater than a linear size of the plate.

12. The invention of claim 1, wherein the first flexible beam is subjected to a stress gradient to control a direction of the motion.

13. The invention of claim 12, wherein the first flexible beam is covered with an additional layer of material to cause a contact region between the common and additional layers to have said stress gradient.

14. The invention of claim 1, wherein:

the device is a part of an array having a plurality of such devices; and

the substrate is a common substrate for said plurality.

15. The invention of claim 14, wherein at least two devices of the plurality share at least one of the two anchors.

16. The invention of claim 14, wherein:

each device of the plurality comprises a fastener that mechanically connects the two anchors of the device; and

at least one of said fasteners is shared by two different devices of the plurality.

17. A method of detecting incident radiation, comprising:

exposing a plate to the incident radiation, wherein the plate is adapted to absorb at least a portion of said radiation;

transferring heat generated in the plate due to said absorption to a first flexible beam to cause the first flexible beam to deform and move the plate with respect to the substrate, wherein;

the first flexible beam is connected between two anchors supported on a substrate;

the plate is mechanically coupled to the first flexible beam; and

the first flexible beam and at least a portion of each of the two anchors have been formed from a common layer of material;

detecting said motion of the plate.

18. The invention of claim 17, wherein said motion comprises rotation or translation of the plate with respect to the substrate.

19. The invention of claim 17, wherein the step of detecting comprises detecting a capacitance change for a capacitor formed by the plate and a stationary electrode disposed on the substrate, wherein the motion of the plate produces said capacitance change.

20. The invention of claim 17, the step of detecting comprises:

reflecting an interrogating optical beam from the plate; and

detecting a phase shift or a propagation direction of the reflected beam.