On-Chip Polarimetry for High-Throughput Screening of Nanoliter and Smaller Sample Volumes

• US 20100027008A1
• Filed: 10/24/2005
• Published: 02/04/2010
• Est. Priority Date: 10/22/2004
• Status: Active Grant

• Current Assignee: Vanderbilt University
• Original Assignee: Vanderbilt University
• Inventors: Bachmann, Brian O., Dotson, Stephen, Bornhop, Daryl J.
• Granted Patent: US 8,134,707 B2
• Time in Patent Office: Days
• US Class Current: 356/364
• CPC Class Codes: G01J 4/04 Polarimeters using electric detection means G01J4/02 takes precedence
• CPC Class Codes: G01N 21/21 Polarisation-affecting properties G01N21/19 takes precedence

Abstract

A polarimetry technique for measuring optical activity that is particularly suited for high throughput screening employs a chip or substrate (22) having one or more microfluidic channels (26) formed therein. A polarized laser beam (14) is directed onto optically active samples that are disposed in the channels. The incident laser beam interacts with the optically active molecules in the sample, which slightly alter the polarization or the loser beam as it passes multiple times through the sample. Interference fringe patters (28) are generated by the interaction of the laser beam with the sample and the channel walls. A photodetector (34) is positioned to receive the interference fringe patterns and generate an output signal that is input to a computer or other analyzer (38) for analyzing the signal and determining the rotation of plane polarized light by optically active material in the channel from polarization rotation calculations.

Claims

1. A system for measuring optical activity in a sample comprising:

a chip having a channel formed therein for reception of a sample to be analyzed;

a source of plane polarized light for generating and directing an incident beam of radiation onto said channel; and

a polarization detector for receiving interference fringe pattern radiation that is scattered by said channel and said sample when said beam of radiation is incident thereon and determining whether said scattered radiation has a plane of polarization that has been rotated relative to the plane of polarization by optically active molecules in said sample.

2. The system of claim 1, wherein said chip is formed from glass and said channel has a generally hemispherical cross section.

3. The system of claim 2, wherein said chip is formed form fused silica.

4. The system of claim 1, wherein said chip is formed from a plastic of optical quality.

5. The system of claim 4, wherein said channel has a rectangular cross section.

6. The system of claim 4, wherein said plastic is PDMS.

7. The system of claim 1, wherein said detector for receiving interference fringe pattern radiation that is scattered by said channel and said sample when said beam of radiation is incident thereon is positioned to receive side scattered radiation that is directed along an axis that is at an angle of 65-90 degrees relative to an axis of said incident laser beam, said side scattered radiation containing high frequency polarization rotation dependent components.

8. The system of claim 7, wherein said detector for receiving interference fringe pattern radiation that is scattered by said channel and said sample when said beam of radiation is incident thereon is positioned to receive radiation that is directed along an axis that is at an angle of approximately 80 degrees relative to an axis of said incident laser beam.

9. The system of claim 1, wherein said detector for receiving interference fringe pattern radiation that is scattered by said channel and said sample when said beam of radiation is incident thereon is positioned to receive radiation that is directly back scattered along an axis that is at an angle of 5-10 degrees relative to an axis of said incident laser beam.

10. The system of claim 9, wherein said detector for receiving interference fringe pattern radiation that is scattered by said channel and said sample when said beam of radiation is incident thereon is positioned to receive radiation that is directly back scattered along an axis that is at an angle of approximately 7 degrees relative to an axis of said incident laser beam.

11. The system of claim 10, wherein said source of plane polarized light for generating and directing a beam of radiation onto said channel comprises a laser and a first polarimetry plate disposed between said laser and said chip.

12. The system of claim 11, further comprising a second polarimetry plate disposed between said chip and said detector for filtering refractive index dependent low frequency components in said scattered radiation.

13. The system of claim 1, wherein said chip includes a plurality of channels formed therein for reception of a corresponding plurality of samples to be analyzed, and said source of plane polarized light and said detector are mounted on a carriage that is movable with a motorized translation system to adjust the position of said source and detector with respect to said channels.

14. The system of claim 1, wherein said detector includes a signal analyzing device for receiving said signal from said detector and determining a degree to which said scattered radiation has a plane of polarization that has been rotated relative to the plane of polarization by optically active molecules in said sample.

15. The system of claim 14, further including a beam splitter and a reference detector, said beam splitter being positioned to direct a portion of said incident beam of radiation from said source to said reference detector, which generates a signal that is fed to said analyzer and is employed by said analyzer to compensate for variations in said incident beam.

17. The method of claim 1, wherein the step of providing said chip comprises providing a chip that is made from a material selected from the group comprising glass, plastic, fused silica and PDMS.

16. A method for analyzing an optically active sample comprising the steps of:

providing a chip having a channel formed therein for reception of a sample to be analyzed;

disposing a sample to be analyzed in said channel;

directing an incident beam of plane polarized light onto said channel;

detecting an interference fringe pattern that is generated by said channel and said sample when said beam of radiation is incident thereon and scattered thereby; and

determining from said interference fringe pattern, whether said scattered beam of radiation has a plane of polarization that has been rotated relative to the plane of polarization by optically active molecules in said sample.

18. The method of claim 16, wherein the step of detecting an interference fringe pattern comprises positioning an optical detector to receive side scattered radiation that is directed along an axis that is at an angle of 65-90 degrees relative to an axis of said incident laser beam, said side scattered radiation containing high frequency polarization rotation dependent components.

19. The method of claim 18, wherein said detector for receiving interference fringe pattern radiation that is scattered by said channel and said sample when said beam of radiation is incident thereon is positioned to receive radiation that is directed along an axis that is at an angle of approximately 80 degrees relative to an axis of said incident laser beam.

20. The method of claim 16, wherein the step of detecting an interference fringe pattern comprises positioning an optical detector to receive radiation that is directly back scattered along an axis that is at an angle of 5-10 degrees relative to an axis of said incident laser beam.

21. The method of claim 20, wherein said detector for receiving interference fringe pattern radiation that is scattered by said channel and said sample when said beam of radiation is incident thereon is positioned to receive radiation that is directly back scattered along an axis that is at an angle of approximately 7 degrees relative to an axis of said incident laser beam.

22. The method of claim 21, wherein said step of directing an incident beam of plane polarized light onto said channel comprises directing said incident beam from a laser through a first polarimetry plate and onto said channel.

23. The method of claim 22, further comprising the step of positioning a second polarimetry plate between said chip and said detector for filtering refractive index dependent low frequency components in said scattered radiation.