Quasi-Compact Range

• US 20100039332A1
• Filed: 11/05/2007
• Published: 02/18/2010
• Est. Priority Date: 11/05/2007
• Status: Active Grant

• Current Assignee: Aerospace Corporation
• Original Assignee: Aerospace Corporation
• Inventors: Pisano III, Frank A., Thompson, David A., Dybdal, Robert B.
• Granted Patent: US 7,965,228 B2
• Time in Patent Office: Days
• US Class Current: 343/703
• CPC Class Codes: G01R 29/105 using anechoic chambers; Chambers or open field sites used therefor test sites used for measuring on other objects than aerials G01R29/0828; wave absorbing devices H01Q17/00
• CPC Class Codes: H04B 17/382 for resource allocation, admission control or handover

Abstract

An antenna method includes using a reflector antenna to produce a test field within a test region at a quasi-compact range, which is within a near-field of the reflector antenna but further from an aperture plane of the reflector antenna than a compact range of the reflector antenna.

Claims

1. An antenna method comprising:

using a reflector antenna to produce a test field within a test region at a quasi-compact range, which is within a near-field of the reflector antenna but further from an aperture plane of the reflector antenna than a compact range of the reflector antenna.

2. The antenna method of claim 1, wherein the quasi-compact range is approximately 0.16 D²/λ

, wherein D is the diameter of the reflector antenna, and λ

is the wavelength of a signal source provided to the reflector antenna.

3. The antenna method of claim 1, wherein the test field is substantially uniform within the test region.

4. The antenna method of claim 1, wherein the reflector antenna is used without edge treatments.

5. The antenna method of claim 1, wherein using a reflector antenna to produce a test field includes providing an amplitude symmetric pattern.

6. The antenna method of claim 1, further comprising:

defocusing a feed of the reflector antenna to decrease a phase variation of the test field.

7. The antenna method of claim 1, further comprising:

positioning an article to be measured within the test region.

8. The antenna method of claim 7, wherein the article to be measured is an antenna under test.

9. The antenna method of claim 7, wherein positioning an article to be measured includes repositioning the article within the test region.

10. An antenna method comprising:

determining a quiet zone within a near-field of a reflector antenna and further away from the reflector antenna than a compact range of the reflector antenna in which a test field generated by the reflector antenna is substantially uniform and;

positioning a test object within the quiet zone; and

using the reflector antenna to measure the test object.

11. The antenna method of claim 10, wherein determining a quiet zone includes determining a quasi-compact range which is approximately 0.16 D²/λ

, wherein D is the diameter of the reflector antenna, and λ

is the wavelength of a signal source provided to the reflector antenna.

12. The antenna method of claim 10, wherein the reflector antenna is used without edge treatments.

13. The antenna method of claim 10, wherein using the reflector antenna includes providing an amplitude symmetric pattern.

14. The antenna method of claim 10, further comprising:

defocusing a feed of the reflector antenna to decrease a phase variation of the test field.

15. An antenna system comprising:

a reflector antenna configured to generate a test field within a test region at a quasi-compact range which is within a near-field of the reflector antenna and further away from the reflector antenna than a compact range of the reflector antenna.

16. The antenna system of claim 15, wherein the quasi-compact range is approximately 0.16 D²/λ

, wherein D is the diameter of the reflector antenna, and λ

is the wavelength of a signal source provided to the reflector antenna.

17. The antenna system of claim 15, wherein the reflector antenna does not include edge treatments.

18. The antenna system of claim 15, wherein the reflector antenna includes a horn configured to generate an amplitude symmetric pattern.

19. The antenna system of claim 15, wherein a feed of the reflector antenna is defocused to decrease a phase variation of the test field.

20. The antenna system of claim 15, wherein the reflector antenna is configured such that the test field is generated to be substantially uniform within the test region, with feed blockage scattering attenuated and edge diffraction terms reduced as compared to the compact range.

21. The antenna system of claim 15, wherein the reflector antenna is configured to generate the test field such that the antenna system requires less test facility reflectivity performance than with a far-field pattern.

22. The antenna system of claim 15, wherein the reflector antenna is configured to generate the test field such that the antenna system has higher measurement sensitivity than with a far-field pattern.