SYSTEM AND APPARATUS FOR WIRELESS HIGH-FREQUENCY TEMPERATURE ACQUISITION AND ANALYSIS

• US 20100042013A1
• Filed: 08/15/2009
• Published: 02/18/2010
• Est. Priority Date: 08/17/2008
• Status: Abandoned Application

• Current Assignee: InnovaTec SL
• Original Assignee: InnovaTec SL
• Inventors: CUESTA FRAU, DAVID, VARELA ENTRECANALES, MANUEL, RIOBO ABOY, PEDRO MATEO
• Application Number:
  US12/541,914
• Publication Number:
  US 20100042013A1
• Time in Patent Office: Days
• US Class Current: 600/549
• CPC Class Codes: A61B 5/0008 Temperature signals
• CPC Class Codes: A61B 5/01 Measuring temperature of body parts ; Diagnostic temperature sensing, e.g. for malignant or inflamed tissue clinical contact thermometers G01K13/20
• CPC Class Codes: G01K 1/022 for recording
• CPC Class Codes: G01K 1/024 for remote indication
• CPC Class Codes: G01K 13/20 Clinical contact thermometers for use with humans or animals
• CPC Class Codes: G16H 40/67 for remote operation

Abstract

We disclose a system, an apparatus, and a method for high frequency temperature monitoring and analysis. According to a disclosed embodiment the system comprises: (a) a wireless temperature acquisition and logging device especially designed for multi-day, high-frequency, and high-resolution temperature sampling; and (b) an analysis system implemented in a digital computer with one or more processors in order to analyze and characterize said temperature using a plurality of methods including complexity analysis techniques such as Lempel-Ziv complexity, Approximate Entropy, Sample Entropy, Multiscale Entropy, and Detrended Fluctuation Analysis; and other statistical time-series analysis techniques. According to one embodiment the temperature monitoring system is designed to capture the dynamic aspects of temperature in order to enable researchers and clinicians to study temperature regulation, thermal physiology, and clinical thermometry.

Claims

1. A system for taking temperature measurements and analyzing said measurements, comprising:

(a) a wireless temperature acquisition and logging device for acquiring, storing, and wirelessly transmitting said temperature measurements; and

(b) an analysis system implemented in a digital computer with one or more processors in order to analyze and characterize said temperature using one or more time-series analysis methods.

2. The system of claim 1, wherein said wireless temperature acquisition and logging device is especially designed for multi-day, high-frequency, and high-resolution temperature measurements.

3. The system of claim 2, wherein said wireless temperature acquisition and logging device comprises one or more temperature sensors, one or more signal conditioners, one or more signal amplifiers, an analog-to-digital converter, a microcontroller, a memory, a wireless communication module, a power circuit, and a power source.

4. The system of claim 3, wherein said memory is substantially equivalent to a flash memory, said wireless communication module is substantially equivalent to Bluetooth, and said power circuit includes a dc-to-dc converter.

5. The system of claim 2, wherein said time-series analysis methods include complexity analysis techniques.

6. The system of claim 5, wherein said complexity analysis techniques include calculating an Approximate Entropy metric of said temperature.

7. The system of claim 5, wherein said complexity analysis techniques include calculating a Sample Entropy metric of said temperature.

8. The system of claim 5, wherein said complexity analysis techniques include calculating a Lempel-Ziv metric of said temperature.

9. The system of claim 5, wherein said complexity analysis techniques include calculating a Detrended Fluctuation metric of said temperature.

10. A system for taking temperature measurements, analyzing said measurements, and characterizing a patient'"'"'s temperature time-series to help make clinical decisions regarding a patient'"'"'s clinical condition, comprising:

(a) a wireless temperature acquisition and logging device especially designed for multi-day, high-frequency, and high-resolution temperature measurements for acquiring, storing, and wirelessly transmitting said temperature measurements; and

(b) an analysis system implemented in a digital computer with one or more processors in order to analyze and characterize said temperature using one or more complexity analysis methods and generate an output temperature complexity metric, said output temperature complexity metric is automatically compared against one or more normality thresholds to help make said clinical decisions regarding said patient'"'"'s condition.

11. The system of claim 10, wherein said complexity analysis techniques include calculating an Approximate Entropy metric of said temperature.

12. The system of claim 10, wherein said complexity analysis techniques include calculating a Sample Entropy metric of said temperature.

13. The system of claim 10, wherein said complexity analysis techniques include calculating a Lempel-Ziv metric of said temperature.

14. The system of claim 10, wherein said complexity analysis techniques include calculating a Detrended Fluctuation metric of said temperature.

15. A method for assessing a patient'"'"'s condition, comprising:

(a) collecting a temperature time-series using a temperature acquisition and logging device especially designed for multi-day, high-frequency, and high-resolution temperature measurements;

(b) automatically calculating and displaying a complexity metric at user-specified time intervals and said complexity metric is calculated using a user-specified window length; and

(c) assessing said patient'"'"'s condition by comparing said complexity metric against one or more normality thresholds known to be indicative of a particular clinical condition.

16. The system of claim 15, wherein said complexity metric includes an Approximate Entropy metric of said temperature.

17. The system of claim 15, wherein said complexity metric includes a Sample Entropy metric of said temperature.

18. The system of claim 15, wherein said complexity metric includes a Lempel-Ziv metric of said temperature.

19. The system of claim 15, wherein said complexity metric includes Detrended Fluctuation metric of said temperature.