CAPACITANCE EVALUATION CIRCUIT AND ELECTRONIC DEVICE USING THE SAME

• US 20100042346A1
• Filed: 07/14/2009
• Published: 02/18/2010
• Est. Priority Date: 08/18/2008
• Status: Active Grant

• Current Assignee: Raydium Semiconductor Corporation
• Original Assignee: Raydium Semiconductor Corporation
• Inventors: Kuang, Yu
• Granted Patent: US 8,209,139 B2
• Time in Patent Office: Days
• US Class Current: 702/65
• CPC Class Codes: G01R 27/2605 Measuring capacitance capacitive sensors G01D5/24
• CPC Class Codes: H03K 17/955 using a capacitive detector
• CPC Class Codes: H03K 17/962 Capacitive touch switches
• CPC Class Codes: H03K 2217/960725 Charge-transfer

Abstract

A capacitance evaluation circuit includes a capacitive voltage divider, an analog-to-digital converter (ADC) and a processing module. The capacitive voltage divider includes a switch circuit, a known capacitor and a capacitor under test. The switch circuit is controlled by first and second clock signals. A voltage variation at a first terminal of the known capacitor is coupled to a first terminal of the capacitor under test based on a conduction state of the switch circuit. The ADC converts a voltage on the first terminal of the capacitor under test into a digital signal. The processing module detects a capacitance and a capacitance variation of the capacitor under test according to the digital signal from the ADC and a parameter of the ADC.

Claims

1. A capacitance evaluation circuit, comprising:

a capacitive voltage divider comprising a switch circuit, a first capacitor and a second capacitor, wherein the switch circuit is coupled to the first and second capacitors, the switch circuit is controlled by a first clock signal and a second clock signal, which is an inversion signal of the first clock signal, and a voltage variation of a first terminal of the first capacitor is coupled to a first terminal of the second capacitor based on a conduction state of the switch circuit;

an analog-to-digital converter (ADC), coupled to the capacitive voltage divider, converting a voltage of the first terminal of the second capacitor into a first digital signal; and

a processing module, coupled to the ADC, detecting a capacitance of the second capacitor and a capacitance variation of the second capacitor according to the first digital signal of the ADC and a parameter of the ADC.

2. The capacitance evaluation circuit according to claim 1, wherein the switch circuit of the capacitive voltage divider comprises:

a first switch having a first terminal coupled to a first voltage source, and a second terminal coupled to the first terminal of the second capacitor, wherein the first clock signal controls the first switch to turn on;

a second switch having a first terminal coupled to the first voltage source, and a second terminal coupled to the first terminal of the first capacitor, wherein the first clock signal controls the second switch to turn on; and

a third switch having a first terminal coupled to a second voltage source, and a second terminal coupled to the first terminal of the first capacitor, wherein the second clock signal controls the third switch to turn on,

wherein a second terminal of the first capacitor is coupled to the first terminal of the second capacitor, and the second terminal of the second capacitor is coupled to a third voltage source.

3. The capacitance evaluation circuit according to claim 2, wherein:

the parameter of the ADC comprises a resolution and a full scale of the ADC; and

the processing module further detects the capacitance and the capacitance variation of the second capacitor according to a voltage value of the first voltage source, a voltage value of the second voltage source, a capacitance of the first capacitor, the resolution of the ADC, the full scale of the ADC and the first digital signal of the ADC.

4. The capacitance evaluation circuit according to claim 1, further comprising:

a bias circuit, coupled to the capacitive voltage divider and the ADC, applying a bias to a first node so that a voltage of the first node relates to the bias and the voltage of the first terminal of the second capacitor.

5. The capacitance evaluation circuit according to claim 1, wherein the ADC comprises:

a switch-sample-capacitor circuit having a first input terminal and an output terminal, wherein the first input terminal of the switch-sample-capacitor circuit is coupled to the first terminal of the second capacitor of the capacitive voltage divider, and the switch-sample-capacitor circuit is controlled by the first clock signal and the second clock signal to sample the voltage of the first terminal of the second capacitor of the capacitive voltage divider;

an operation amplifier having a first input terminal coupled to the output terminal of the switch-sample-capacitor circuit and further having a second input terminal, a first output terminal and a second output terminal;

a comparator having a first input terminal coupled to the first output terminal of the operation amplifier, a second input terminal coupled to the second output terminal of the operation amplifier, and an output terminal for outputting a second digital signal;

a latch, receiving the second digital signal outputted from the comparator, wherein the latch outputs the second digital signal as a third digital signal under triggering of the first clock signal;

an inverter, inverting the third digital signal;

a counter, counting the third digital signal to generate the first digital signal; and

a switch-capacitor circuit coupled to the second input terminal of the operation amplifier and controlled by the first clock signal, the second clock signal, the third digital signal and the inversion signal of the third digital signal.

6. An electronic device, comprising:

a capacitor under test, outputting a voltage under test;

a sensor, outputting a sensing signal;

a multiplexer, coupled to the capacitor under test and the sensor, outputting one of the voltage under test and the sensing signal; and

an analog-to-digital converter (ADC), coupled to the multiplexer, converting one of the voltage under test and the sensing signal into a digital output signal, which represents one of a capacitance of the capacitor under test and a capacitance variation of the capacitor under test, and a sensed result of the sensor.

7. The electronic device according to claim 6, further comprising:

a touch screen, wherein the capacitor under test is disposed within the touch screen.