HIGH-SPEED RFID CIRCUIT PLACEMENT METHOD AND DEVICE
First Claim
1. A method of making an RFID device, comprising:
- testing an RFID circuit that is on a web of RFID circuits;
if the RFID circuit is determined by the testing to be non-defective, positioning the non-defective RFID circuit in an RFID circuit separation device;
separating the non-defective RFID circuit from the web of RFID circuits with a singulating member;
directing the non-defective RFID circuit onto a rotary placement device and holding the non-defective RFID circuit with a negative pressure with a singulating member; and
placing the non-defective RFID circuit onto an electrical component with the rotary placement device;
if the RFID circuit is determined by the testing to be defective, advancing the defective RFID circuit to a scrap RFID web removal device; and
removing the defective RFID circuit from the web, with the scrap RFID web removal device.
1 Assignment
0 Petitions
Accused Products
Abstract
A high-speed machine and method for placing an RFID circuit onto an electrical component includes separating an RFID circuit from a web of RFID circuits, and placing the RFID circuit onto an electrical component with a placing device. The separating includes directing the RFID circuit onto a transfer drum of the placement device and separably coupling the RFID circuit to the transfer drum. According to one method, a separator device separates and directs chips or interposers onto a placement device. According to another method, chips or interposers are tested before being separated from a web, and if good, are separated from the web, directed onto a placement device, and placed on an electrical component. If defective, the chips or interposers are not directed onto a placement device and are removed by a scrap web removal device.
101 Citations
20 Claims
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1. A method of making an RFID device, comprising:
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testing an RFID circuit that is on a web of RFID circuits; if the RFID circuit is determined by the testing to be non-defective, positioning the non-defective RFID circuit in an RFID circuit separation device; separating the non-defective RFID circuit from the web of RFID circuits with a singulating member; directing the non-defective RFID circuit onto a rotary placement device and holding the non-defective RFID circuit with a negative pressure with a singulating member; and placing the non-defective RFID circuit onto an electrical component with the rotary placement device; if the RFID circuit is determined by the testing to be defective, advancing the defective RFID circuit to a scrap RFID web removal device; and removing the defective RFID circuit from the web, with the scrap RFID web removal device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of making an RFID device, comprising the steps of;
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advancing a web of RFID circuits at a first speed; testing each of the RFID circuits; if the RFID circuit is determined by the testing to be non-defective, positioning the non-defective RFID circuit in an RFID separation device; rotating a rotary placement device to pick up the non-defective RFID circuit from the RFID separation device at the first speed; transferring the non-defective RFID circuit from the rotary placement device to an electrical component web at a second speed; if the RFID circuit is determined by the testing to be defective, advancing the defective RFID circuit to a scrap RFID web removal device; and moving the web of RFID circuits and scrap RFID web removal device cooperatively with one another. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. A method of making an RFID device, comprising the steps of:
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advancing a web of RFID circuits at a first speed; testing each of the RFID circuits; marking each RFID circuit that is defective; reading each of the RFID circuits on the web; if the RFID circuit is determined by the testing to be non-defective, positioning the non-defective RFID circuit in an RFID separation device; moving a placement device to pick up the non-defective RFID circuit from the RFID separation device at the first speed; transferring the non-defective RFID circuit from the placement device to an electrical component web at a second speed; if the RFID circuit is determined by the testing to be defective; and
advancing the defective RFID circuit to a scrap RFID web removal device. - View Dependent Claims (18, 19, 20)
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Specification