DIAGNOSTIC PROBE ASSEMBLY FOR PRINTHEAD INTEGRATED CIRCUITRY

• US 20100045315A1
• Filed: 08/19/2008
• Published: 02/25/2010
• Est. Priority Date: 08/19/2008
• Status: Active Grant

• Current Assignee: Memjet Technology Ltd. (Memjet Limited)
• Original Assignee: Silverbrook Research Pty Limited
• Inventors: Stacey, William John, Kolodko, Julian Paul, McAlpin, Neil, O'Donnell, Eric Patrick, Thelander, Jason Mark, Edwards, Neil Fyfe, Sheahan, John Robert, Sleijpen, Stephen John
• Granted Patent: US 7,866,784 B2
• Time in Patent Office: Days
• US Class Current: 324/762.20
• CPC Class Codes: B41J 29/393 Devices for controlling or analysing the entire machine ; Controlling or analysing mechanical parameters involving printing of test patterns

Abstract

The invention provides for a diagnostic probe assembly for a tester which is used to diagnose printhead integrated circuits. The probe assembly includes a support assembly and a controller board mounted on the support assembly and having a processor configured to generate test signals for testing a printhead integrated circuit. A routing board is in operative signal communication with the controller board and is configured to multiplex the generated test signals for respective dies of the printhead integrated circuits. The probe assembly also includes a probe interface in signal communication with the routing board and configured for relaying the multiplexed test signals to and from the respective dies.

Claims

1. A diagnostic probe assembly for a tester which is used to diagnose printhead integrated circuits, the probe assembly comprising:

a support assembly

a controller board mounted on the support assembly and having a processor configured to generate signals for testing a printhead integrated circuit;

a routing board mounted on the support assembly and in operative signal communication with the controller board, the routing board configured to multiplex the generated signals for respective dies of the printhead integrated circuits; and

a probe interface mounted on the support assembly and in operative signal communication with the routing board, the probe interface configured for relaying the multiplexed test signals to and from the respective dies.

2. The probe assembly of claim 1, in which the probe interface includes an adaptor board having a converter for converting the signals to printhead integrated circuit electrical signals.

3. The probe assembly of claim 2, wherein the converter is configured to generate a reset signal to facilitate multiplexing of the signals to the respective dies of the printhead integrated circuits.

4. The probe assembly of claim 1, wherein the probe interface includes a push bar to provide rigidity and mechanical support to the interface during engagement of the interface with the printhead integrated circuits.

5. The probe assembly of claim 2, wherein the routing board includes board connectors for receiving the controller board and adaptor board, the routing board having power circuits for supplying said controller and adaptor boards with electrical power.

6. The probe assembly of claim 5, wherein the support assembly includes a support plate and brackets extending from the support plate, the controller board being fixed to the brackets and the routing board being fixed to the support plate, which defines an aperture for access to the probe interface.

7. The probe assembly of claim 1, wherein the processor of the controller board is configured to generate test signals suitable for one of a group of tests consisting of:

a gross Idd test, an Ipos test, a protection diode voltage threshold test, a wirebond continuity test, a leakage current test, a signal input voltage threshold test, a signal output voltage test, and a test for functional vectors.