SYSTEM FOR TESTING INTEGRATED CIRCUITS
First Claim
1. A system for testing integrated circuits, the system comprising:
- a local computational device;
a communications link connected to the computational device;
testing circuitry operatively connected to the computational device via the communications link and configured to generate integrated circuitry test signals;
adaptor circuitry connected to the testing circuitry and configured to provide an electrical and physical interface with the integrated circuitry;
routing circuitry interposed between the testing and adaptor circuitry to rout the test signals to respective dies in the integrated circuitry;
a handling mechanism for retaining and manipulating a carrier on which the integrated circuitry is positioned; and
a controller operatively connected to the handling mechanism for controlling operation thereof and connected to the communications device for supervision by the computational device.
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Accused Products
Abstract
The invention provides for a system for testing integrated circuitry. The system includes a local computational device, a communications link connected to the computational device, and testing circuitry operatively connected to the computational device via the communications link and configured to generate integrated circuitry test signals. The system also includes adaptor circuitry connected to the testing circuitry and configured to provide an electrical and physical interface with the integrated circuits, as well as routing circuitry interposed between the testing and adaptor circuitry to rout the test signals to respective dies of the integrated circuits. Also included is a handling mechanism for retaining and manipulating a carrier on which the integrated circuits are positioned, and a controller operatively connected to the handling mechanism for controlling operation thereof and connected to the communications device for supervision by the computational device.
15 Citations
9 Claims
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1. A system for testing integrated circuits, the system comprising:
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a local computational device; a communications link connected to the computational device; testing circuitry operatively connected to the computational device via the communications link and configured to generate integrated circuitry test signals; adaptor circuitry connected to the testing circuitry and configured to provide an electrical and physical interface with the integrated circuitry; routing circuitry interposed between the testing and adaptor circuitry to rout the test signals to respective dies in the integrated circuitry; a handling mechanism for retaining and manipulating a carrier on which the integrated circuitry is positioned; and a controller operatively connected to the handling mechanism for controlling operation thereof and connected to the communications device for supervision by the computational device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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Specification