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SYSTEM FOR TESTING INTEGRATED CIRCUITS

  • US 20100049464A1
  • Filed: 08/19/2008
  • Published: 02/25/2010
  • Est. Priority Date: 08/19/2008
  • Status: Abandoned Application
First Claim
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1. A system for testing integrated circuits, the system comprising:

  • a local computational device;

    a communications link connected to the computational device;

    testing circuitry operatively connected to the computational device via the communications link and configured to generate integrated circuitry test signals;

    adaptor circuitry connected to the testing circuitry and configured to provide an electrical and physical interface with the integrated circuitry;

    routing circuitry interposed between the testing and adaptor circuitry to rout the test signals to respective dies in the integrated circuitry;

    a handling mechanism for retaining and manipulating a carrier on which the integrated circuitry is positioned; and

    a controller operatively connected to the handling mechanism for controlling operation thereof and connected to the communications device for supervision by the computational device.

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