Method And Apparatus For Testing Semiconductor Devices With Autonomous Expected Value Generation
First Claim
1. Apparatus for interfacing a tester and a semiconductor device under test (DUT), comprising:
- output processing logic configured to receive test result signals from the DUT responsive to testing by the tester, the output processing logic voting a logic value of a majority of the test result signals as a correct logic value; and
memory configured to store indications of whether each of the test result signals has the correct logic value.
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Accused Products
Abstract
Method and apparatus for testing semiconductor devices with autonomous expected value generation is described. Examples of the invention can relate to apparatus for interfacing a tester and a semiconductor device under test (DUT). An apparatus can include output processing logic configured to receive test result signals from the DUT responsive to testing by the tester, the output processing logic voting a logic value of a majority of the test result signals as a correct logic value; and memory configured to store indications of whether each of the test result signals has the correct logic value.
65 Citations
31 Claims
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1. Apparatus for interfacing a tester and a semiconductor device under test (DUT), comprising:
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output processing logic configured to receive test result signals from the DUT responsive to testing by the tester, the output processing logic voting a logic value of a majority of the test result signals as a correct logic value; and memory configured to store indications of whether each of the test result signals has the correct logic value. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A test system for testing a semiconductor device under test (DUT), comprising:
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test instruments having a tester; a probe card assembly having test probes configured to contact devices on the DUT; output processing logic configured to receive test result signals from groups of pins of the DUT responsive to testing by the tester, the output processing logic configured to vote a logic value of a majority of the test result signals for each group of the pins as a correct logic value; and memory configured to store indications of whether each of the test result signals for each group of the pins has the correct logic value. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A method of testing a semiconductor device under test (DUT), comprising:
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providing a test signal to a plurality of devices on the DUT; capturing values of test result signals generated by the devices on the DUT; voting a logic value of a majority of the test result signals as a correct logic value; comparing each of the values of the test result signals with the correct logic value; and storing indications of whether each of the test result signals has the correct logic value in a memory. - View Dependent Claims (23, 24, 25)
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26. A probe card assembly, comprising:
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test probes configured to contact one or more devices on a semiconductor device under test (DUT); output processing logic configured to receive test result signals from groups of pins of the DUT responsive to testing, the output processing logic configured to vote a logic value of a majority of the test result signals for each group of the pins as a correct logic value; and memory configured to store indications of whether each of the test result signals for each group of the pins has the correct logic value. - View Dependent Claims (27, 28, 29, 30)
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31-51. -51. (canceled)
Specification