STIMULATED EMISSION AND ENHANCED DETECTION OF CHEMICALS AND CHEMICAL COMPOUNDS

• US 20100051814A1
• Filed: 12/25/2008
• Published: 03/04/2010
• Est. Priority Date: 12/26/2007
• Status: Active Grant

• Current Assignee: Alva Labs, LLC
• Original Assignee: Richard Graziano
• Inventors: Graziano, Richard
• Granted Patent: US 8,242,450 B2
• Time in Patent Office: Days
• US Class Current: 250/341.100
• CPC Class Codes: G01N 21/3563 for analysing solids; Preparation of samples therefor
• CPC Class Codes: G01N 21/3581 using far infrared light; using Terahertz radiation
• CPC Class Codes: G01N 21/64 Fluorescence; Phosphorescence
• CPC Class Codes: G01N 21/65 Raman scattering

Abstract

A method and apparatus for remotely detecting, locating, and identifying chemicals and chemical compounds through optically opaque materials. Electromagnetic radiation in the Terahertz range emitted from an antenna array is modulated to excite target molecules. The apparatus then stops the excitation energy and the molecules emit an electromagnetic signature detectable by the device at standoff distances.

Claims

1. An apparatus to detect target materials, comprising:

a oscillator to generate an THz electromagnetic emission;

an antenna to direct the THz electromagnetic emission towards target materials; and

a detector to detect signature emissions of excited molecules in the target materials.

2. The apparatus of claim 1, further comprising:

a power amplifier to boost the signal strength of the THz electromagnetic emission; and

a modulator to modulate the frequency of the THz electromagnetic emission over the frequency spectrum of the target materials.

3. The apparatus of claim 1, wherein the oscillator is a backward wave oscillator.

4. The apparatus of claim 1, wherein the antenna is a horn antenna.

5. The apparatus of claim 2, wherein the modulator is a sweep frequency generator.

6. The apparatus of claim 2, further comprising a computer, said computer applying a modulation algorithm and analyzing detected signature emissions.

7. The apparatus of claim 6, further comprising one or more digital signal processors in communication with said computer.

8. The apparatus of claim 2, further comprising a waveguide propagating the oscillator signal to the amplifier.

9. The apparatus of claim 2, further comprising a feedback detector receiving the modulated THz electromagnetic emission.

10. An apparatus to detect target materials, comprising:

a oscillator to generate an THz electromagnetic emission;

a power amplifier to boost the signal strength of the THz electromagnetic emission;

a modulator to modulate the frequency of the THz electromagnetic emission over the frequency spectrum of the target materials;

an antenna to direct the THz electromagnetic emission towards target materials; and

a detector to detect signature emissions of excited molecules in the target materials.

11. The apparatus of claim 10, further comprising a waveguide propagating the oscillator signal to the amplifier.

12. A method to detect target materials, comprising the steps of:

emitting electromagnetic radiation in the Terahertz range;

modulating the electromagnetic radiation to excite molecules in the target materials; and

detecting signature emissions of excited molecules in the target materials.

13. The method of claim 12, wherein detection is performed at a standoff distance of 50 m.