Chip Testing Apparatus and Testing Method Thereof

• US 20100052696A1
• Filed: 08/26/2009
• Published: 03/04/2010
• Est. Priority Date: 08/29/2008
• Status: Active Grant

• Current Assignee: Xueshan Technologies Inc. (Wi-LAN Inc.)
• Original Assignee: MStar Semiconductor Incorporated (MediaTek, Inc.)
• Inventors: Huang, Chih-Hua, Chang, Chih Yen
• Granted Patent: US 8,552,756 B2
• Time in Patent Office: Days
• US Class Current: 324/537
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28
• CPC Class Codes: G06K 7/0008 General problems related to the reading of electronic memory record carriers, independent of its reading method, e.g. power transfer

Abstract

A chip testing apparatus and a chip testing method are provided. The chip testing apparatus includes a command generating module, a transceiving module and a control module. When the command generating module generates a first test command, the transceiving module transmits the first test command to a radio frequency identification (RFID) chip and receives a target test result from the RFID chip. The control module determines whether the target test result complies with a reference test result. When the determination result of the control module is no, the control module controls the command generating module to generate a second test command for retesting the RFID chip.

Claims

1. A chip testing apparatus for testing a radio frequency identification (RFID) chip, comprising:

a command generating module, for generating a first test command;

a transceiving module, for

transmitting the first test command to the RFID chip, and

receiving a target test result from the RFID chip; and

a control module, for

determining whether the target test result complies with a reference test result, and

controlling the command generating module to generate a second test

command for retesting the RFID chip.

2. The chip testing apparatus as claimed in claim 1, wherein the second test command is different from the first test command.

3. The chip testing apparatus as claimed in claim 1, wherein the RFID chip is coupled to the transceiving module in a wired manner, whereby receiving the first test command or transmit the target test result.

4. The chip testing apparatus as claimed in claim 1, wherein the transceiving module comprises:

a converting unit, for converting a signal format of the first test command to a target signal format complying with the RFID chip.

5. The chip testing apparatus as claimed in claim 1, further comprising:

a simulation module, for generating the reference test result by simulating the first test command.

6. The chip testing apparatus as claimed in claim 1, further comprising:

a comparison chip, for generating the reference test result according to the first test command.

7. The chip testing apparatus as claimed in claim 1, wherein the command generating module comprises:

a database, stored a plurality of test results, wherein when the first test command is generated, the command generating module selects the reference test result corresponding to the first test command from the database.

8. The chip testing apparatus as claimed in claim 1, wherein the command generating module randomly generates the first test command and the second test command.

9. The chip testing apparatus as claimed in claim 1, wherein the control module controlling the command generating module to generate the second test command for retesting the RFID chip when the target test result fails to comply with the reference test result.

10. The chip testing apparatus as claimed in claim 1, wherein the control module controlling the command generating module to generate the second test command for retesting the RFID chip when the target test result successes to comply with the reference test result.

11. A chip testing method for testing an RFID chip, comprising steps of:

(a) generating a first test command;

(b) transmitting the first test command to the RFID chip;

(c) receiving a target test result from the RFID chip;

(d) determining whether the target test result complies with a reference test result; and

(e) generating a second test command for retesting the RFID chip.

12. The chip testing method as claimed in claim 11, wherein the second test command is different from the first test command.

13. The chip testing method as claimed in claim 11, further comprising a step of:

(f) converting a signal format of the first test command to a target signal format complying with the RFID chip.

14. The chip testing method as claimed in claim 11, further comprising a step of:

(g) generating the reference test result by simulating the first test command.

15. The chip testing method as claimed in claim 11, further comprising a step of:

(h) transmitting the first test command to a comparison chip and generating the reference test result according to a response of the comparison chip.

16. The chip testing method as claimed in claim 11, wherein the step (a) further comprising:

selecting the reference test result corresponding to the first test command from a database.

17. The chip testing method as claimed in claim 11, wherein the first test command and the second test command are randomly generated.

18. The chip testing method as claimed in claim 11, wherein the step (b) further comprising transmitting the first test command to the RFID chip via a wire.

19. The chip testing method as claimed in claim 11, wherein the second test command is generated when the target test result fails to comply with the reference test result.

20. The chip testing method as claimed in claim 11, wherein the second test command is generated when the target test result successes to comply with the reference test result.