TEST APPARATUS FOR TESTING CIRCUIT BOARD

• US 20100052712A1
• Filed: 07/06/2009
• Published: 03/04/2010
• Est. Priority Date: 08/26/2008
• Status: Abandoned Application

• Current Assignee: Hon Hai Precision Industry Co., Ltd.
• Original Assignee: Hon Hai Precision Industry Co., Ltd.
• Inventors: Chou, Chun-Hung
• Application Number:
  US12/497,706
• Publication Number:
  US 20100052712A1
• Time in Patent Office: Days
• US Class Current: 324/763.10
• CPC Class Codes: G01R 31/2806 Apparatus therefor, e.g. test stations, drivers, analysers, conveyors G01R31/2805, G01R31/281, G01R31/2818 take precedence
• CPC Class Codes: G01R 31/2818 using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors G01R31/2805 takes precedence; printed circuits having, e.g. symbols, test patterns or visualisation means H05K1/0266

Abstract

The disclosure relates to a test apparatus for testing a circuit board. The circuit board includes a connector and a plurality of test points connected to the connector via a plurality of lines and the connector of the circuit board is connected to the plurality of lines via a plurality of corresponding signal pins. The test apparatus includes a circuit, a connector, a plurality of probes, and a tester. The circuit includes a plurality of test points and lines connecting to the test points correspondingly. The connector is coupled to the connector of the circuit board. The plurality of probes contact with the test points of the test apparatus. The tester sends test-signals to the connector of the circuit board via the lines correspondingly, receives test-information on the test points of the circuit board via the connectors, analyzes the test-information, and generates a test-result of the circuit board.

Claims

1. A test apparatus for testing a circuit board which comprises a connector and a plurality of test points connected to the connector via a plurality of lines, the connector of the circuit board being connected to the plurality of lines via a plurality of corresponding signal pins, the test apparatus comprising:

a circuit, comprising a plurality of test points and lines connecting to the test points correspondingly;

a connector for being coupled to the connector of the circuit board;

a plurality of probes, for contacting with the test points of the test apparatus; and

a tester, for sending test-signals to the connector of the circuit board via the lines correspondingly, receiving test-information on the test points of the circuit board via the connectors, analyzing the test-information, and generating a test-result of the circuit board.

2. The test apparatus as recited in claim 1, wherein the test points are arranged in a line on the circuit.

3. The test apparatus as recited in claim 1, wherein the connector of the test apparatus comprises a plurality of signal pins, and the number of the signal pins is equal to the number of test points of the test apparatus.

4. The test apparatus as recited in claim 3, wherein the number of the signal pins of the connector of the test apparatus is the same as that of the signal pins of the connector of the circuit board.

5. The test apparatus as recited in claim 4, wherein the connector of the test apparatus is configured to connect to the connector of the circuit board via the signal pins.