BROKEN SCREEN DETECTOR

• US 20100053604A1
• Filed: 08/20/2009
• Published: 03/04/2010
• Est. Priority Date: 08/31/2008
• Status: Abandoned Application

• Current Assignee: Mitsubishi Electric US Incorporated (Mitsubishi Electric Corporation)
• Original Assignee: Mitsubishi Electric US Incorporated (Mitsubishi Electric Corporation)
• Inventors: Rice, Paul
• Application Number:
  US12/544,377
• Publication Number:
  US 20100053604A1
• Time in Patent Office: Days
• US Class Current: 356/239.200
• CPC Class Codes: H04N 17/04 for receivers
• CPC Class Codes: H04N 9/3161 using laser light sources using laser beams scanning the display screen H04N9/3129
• CPC Class Codes: H04N 9/3191 Testing thereof testing of displays in general G09G3/006

Abstract

Systems and methods that facilitate the detection of a broken or damaged screen in a laser PTV due to impact or shock through the measure or monitoring of continuity or resistivity of a conductive trace applied to the screen. In one embodiment, a screen damage detection system comprises a clear conductive trace applied to the display screen preferably in a serpentine configuration. Damage to the screen is detected when the hole or crack in the screen is sufficiently large to open the conductive trace. In another embodiment, a damage detection system comprises a clear resistive film applied to the screen. The resistance is measured in the X and Y axis to detect changes in the resistance of the coating due to a crack or hole in the screen and disable the laser through a laser enable output signal when a change in resistance greater than a predetermined value is detected.

Claims

1. A screen damage detection system for a laser PTV comprising

a conductive trace disposed on the surface of a display screen of the PTV, and

a damage detection circuit coupled to the conductive trace and configured to detect discontinuity in the conductive trace due to damage of the screen.

2. The system of claim 1 wherein the detected discontinuity is a function of the resistivity of the trace.

3. The system of claim 1 wherein the trace is formed from a transparent conductive material.

4. The system of claim 3 wherein the transparent conductive material is indium tin oxide (ITO).

5. The system of claim 1 wherein the trace is formed in a serpentine configuration.

6. The system of claim 1 wherein the pitch of the trace is less than one half of the smallest size of a hole, crack or chip in the screen to be detected.

7. The system of claim 1 wherein the circuit is adapted to cause the shut down of a laser light source when discontinuity in the trace is detected.

8. The system of claim 7 wherein the circuit comprises

a comparator,

a first lead coupled to a first end of the trace and connected to electrical ground,

a second lead coupled to a second end of the trace and to a negative input of the comparator,

a pull-up resistor connected to the second lead and a power source, and

first and second divider resisters connected to electrical ground and the power source and coupled in parallel to a positive input of the comparator,

wherein the comparator being adapted to compare a reference voltage created by divider resistors on the positive input of the comparator to the voltage on the negative input of the comparator.

9. The system of claim 8 wherein the pull-up resister is adapted to pull the negative input of the comparator high due to discontinuity in the trace.

10. The system of claim 8 wherein the comparator is adapted to output an output signal that corresponds to the high input on its negative input to signal a control system to shut down a laser light source.

11. A screen damage detection system for a laser PTV comprising

a resistive film disposed on a surface of a display screen of the PTV, and

a damage detection circuit coupled to the resistive film and configured to detect damage to the screen as a function of a change in resistivity of the film. 12. The system of claim 11 wherein the resistive film comprises a thin metallic layer.

12. The system of claim 11 wherein the film is formed from a transparent resistive material.

13. The system of claim 11 wherein the circuit detects a change in resistivity as a function voltage drop across the film.

14. The system of claim 11 wherein the circuit is adapted to cause the shut down of a laser light source when a change in resistivity is detected.

15. The system of claim 14 wherein the circuit comprises

a first set of electrodes positioned along the side edges of the screen,

a second set of electrodes positioned along the top and bottom edges of the screen,

a comparator circuit,

a switch coupled to the comparator circuit,

a current source coupled to the comparator and the switch, and

first and second sets of wire leads coupled to the first and second set of electrodes and the set of switches.

16. The system of claim 15 wherein the switch comprises a set of switches.

17. The system of claim 16 wherein the comparator circuit comprises an analog-to-digital converter and a microprocessor, the microprocessor records the normal resistance of screen in an undamaged state along the axis extending between the electrodes of the first and second sets of electrodes, controls the set of switches to sample the resistance along each axis to detect changes in the resistance of the film and outputs a disable signal when a change in resistance greater than a predetermined value is detected.

18. The system of claim 17 wherein the comparator circuit comprise a temperature sensor coupled to the microprocessor.