Monolithic Comb Drive System and method for Large-Deflection Multi-Dof Microtransduction

• US 20100064395A1
• Filed: 06/22/2009
• Published: 03/11/2010
• Est. Priority Date: 03/12/2007
• Status: Active Grant

• Current Assignee: Purdue Research Foundation (Purdue University)
• Original Assignee: Purdue Research Foundation (Purdue University)
• Inventors: Clark, Jason Vaughn
• Granted Patent: US 8,429,954 B2
• Time in Patent Office: Days
• US Class Current: 850/26
• CPC Class Codes: G01Q 40/00 Calibration, e.g. of probes
• CPC Class Codes: G01R 1/06727 Cantilever beams

Abstract

A scanning probe microscope includes a plate moveable in an x-axis direction, a y-axis direction, and a z-axis direction, and a probe tip coupled to the plate. A plurality of actuators cooperate to move the probe tip with three degrees of freedom of movement.

Claims

1. A scanning probe microscope apparatus comprising:

a probe tip coupled to a first plate moveable in an x-axis direction, a y-axis direction and a z-axis direction;

a first actuator configured to move the plate and the probe tip in the y-axis direction;

a second actuator configured to move the plate and the probe tip in a z-axis direction; and

a third actuator configured to move the probe tip in the x-axis direction, the first, second and third actuators cooperating to move the probe tip with three degrees of freedom of movement.

2. The apparatus of claim 1, wherein the first actuator includes a comb drive actuator coupled to a second plate, the second plate being coupled to the first plate by at least one flexure.

3. The apparatus of claim 2, wherein the third actuator includes a comb drive having a first set of fingers coupled to a third plate, the first set of fingers coupled to third plate cooperating with a second set of fingers coupled to the first plate to move the first plate and the probe tip in the x-axis direction.

4. The apparatus of claim 1, further comprising a capacitance sensor configured to sense a change in capacitance upon engagement of the probe tip with a sample.

5. The apparatus of claim 4, wherein a change in capacitance measured by the capacitance meter is used to determine at least one of deflection of the probe tip and force applied to the probe tip.

6. The apparatus of claim 1, wherein the scanning probe microscope is one of an atomic force microscope and a scanning tunneling microscope.

7. The apparatus of claim 1, further comprising a controller configured to measure an electrical measurand to determine at least one of deflection of the probe tip and force applied to the probe tip, and an electrostatic sensor located at a point of largest vibration of the apparatus, the electrostatic sensor providing an output signal coupled to a controller to reduce the effect of noise-induced vibrations on the system.

8. A scanning probe microscope apparatus comprising:

first and second anchors rigidly coupled to a substrate;

first and second flexures coupled to the first and second anchors, respectively;

a first plate coupled to the first flexure;

a second plate coupled to the first plate by at least one third flexure, the second plate being moveable in an x-axis direction, a y-axis direction, and a z-axis direction;

a probe tip coupled to the second plate;

a third plate coupled to the first plate by at least one connecting structure, the third plate being coupled to the second anchor by the second flexure;

a first actuator coupled to the first plate, the first actuator being configured to move the first and second plates and probe tip in the y-axis direction;

a second actuator configured to move the third plate, the second plate and probe tip in the z-axis direction; and

a third actuator configured to move the second plate and the probe tip in the x-axis direction.

9. The apparatus of claim 8, wherein the first actuator includes an in-plane comb drive actuator configured to move the first and second plates and the probe tip in the y-axis direction.

10. The apparatus of claim 8, wherein the second actuator is an out-of-plane actuator configured to move the third and second plates and the probe tip in the z-axis direction.

11. The apparatus of claim 8, wherein the third actuator is a monolithic comb drive actuator.

12. The apparatus of claim 8, wherein displacement of the probe tip in both the x-axis direction and y-axis direction is at least 7 μ

m.

13. The apparatus of claim 8, further comprising a controller configured to measure an electrical measurand to determine at least one of deflection of the probe tip and force applied to the probe tip, and an electrostatic sensor located at a point of largest vibration of the apparatus, the electrostatic sensor providing an output signal coupled to a controller to reduce the effect of noise-induced vibrations on the system.

14. The apparatus of claim 8, wherein an electric potential across the second actuator is produced by applying an electric potential difference between the first and second anchors.

15. The apparatus of claim 8, further comprising a capacitance meter coupled to the first and second anchors, the capacitance meter sensing change in capacitance upon engagement of the probe tip with a sample to determine at least one of deflection of the probe tip and force applied to the probe tip.

16. A scanning probe microscope having three degrees of freedom of movement comprising:

first and second anchors rigidly coupled to a substrate;

first and second flexures coupled to the first and second anchors, respectively;

a first plate coupled to the first flexure;

a first drive actuator coupled to the first plate;

an electrode coupled to the first plate;

a second plate coupled to the first plate by a third flexure;

a third plate coupled to the first plate by at least one structure, the third plate also being coupled to the second anchor by the second flexure;

a second drive actuator located between the second and third plates; and

a probe tip coupled to the second plate, wherein the first and second flexures and the first drive actuator provide a first degree of freedom of movement of the probe tip, the electrode provides a second degree of freedom of movement of the probe tip, and the third flexure and the second drive actuator provide a third degree of freedom of movement of the probe tip.

17. The apparatus of claim 16, wherein an electric potential across the second drive actuator is produced by applying an electric potential difference between the first and second anchors.

18. The apparatus of claim 17, further comprising a capacitance meter coupled to the first and second anchors, the capacitance meter sensing change in capacitance caused by deflection of the third flexure upon engagement of the probe tip with a sample.

19. The apparatus of claim 18, wherein a change in capacitance measured by the capacitance meter is used to determine at least one of deflection of the probe tip and force applied to the probe tip.

20. The apparatus of claim 16, wherein the scanning probe microscope is one of an atomic force microscope and a scanning tunneling microscope.