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IN-LINE PROCESS MEASUREMENT SYSTEMS AND METHODS

  • US 20100073666A1
  • Filed: 03/27/2008
  • Published: 03/25/2010
  • Est. Priority Date: 03/30/2007
  • Status: Active Grant
First Claim
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1. A method of using multivariate optical computing to collect real-time data about a process stream of a target material, said method comprising:

  • (a) installing an optical analysis system proximate a process line, the process line having a transmissive window installed therein and being configured to move the target material past the transmissive window for analysis by the optical analysis system;

    (b) illuminating a portion of the target material in the area of the transmissive window with a modulated light from the optical analysis system, said light being in the form of light pulses;

    (c) capturing said light pulses as said pulses are reflected from the illuminated portion of the target material, said pulses carrying information about a property of the illuminated portion of the target material;

    (d) directing a portion of said information-carrying pulses through at least one multivariate optical element in the optical analysis system to produce a stream of instaneous measurement results; and

    (e) continuously averaging the stream of instantaneous measurement results over a period of time to determine an overall measurement of said property of the target material.

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