Method for capturing and analyzing test result data

• US 20100076724A1
• Filed: 09/23/2008
• Published: 03/25/2010
• Est. Priority Date: 09/23/2008
• Status: Abandoned Application

• Current Assignee: Harold Lee Brown, Phillip A. Justice
• Original Assignee: Harold Lee Brown, Phillip A. Justice
• Inventors: Justice, Phillip A., Brown, Harold Lee
• Application Number:
  US12/284,560
• Publication Number:
  US 20100076724A1
• Time in Patent Office: Days
• US Class Current: 702/179
• CPC Class Codes: G06Q 50/04 Manufacturing
• CPC Class Codes: Y02P 90/30 Computing systems specially adapted for manufacturing

Abstract

A method, system, and graphical user interface display for an efficient and effective characterization and analysis of test data for diverse products from a wide variety of industries using both successful test data and failure test data.

Claims

1. A method for data analysis comprising the steps of:

a) Providing test data;

b) Selecting either pass only data or all data;

c) processing the selected data; and

d) displaying either the mean, standard deviation, lower Z-score, upper Z-score, yield, and defects per unit or the parts per million and defects per unit.

2. A method for data analysis comprising the steps of:

a) Collecting and aggregating data files;

b) Loading statistical analysis software;

c) Initiating software and displaying software graphical user interface of a resource tab;

d) Loading parser;

e) Selecting data files to be processed;

f) Displaying of selected data files in the graphical user interface;

g) Selecting data files for optional removal;

h) Optionally removing selected data files for optional removal;

i) Optionally removing all data files and returning to step e above or termination software;

j) Importing data files for parsing;

k) Parsing data files by extracting and storing product part name into a data storage unit;

l) Parsing data files by extracting and storing product part number into the data storage unit;

m) Parsing data files by extracting and storing product part number revision level into the data storage unit;

n) Parsing data files by extracting and storing product serial number into the data storage unit;

o) Parsing data files by extracting and storing number of test failures into the data storage unit;

p) Parsing data files by extracting and storing test status into the data storage unit;

q) Parsing data files by extracting and storing test environment into the data storage unit;

r) Parsing data files by extracting and storing test start time into the data storage unit;

s) Parsing data files by extracting and storing test end time into the data storage unit;

t) Parsing data files by extracting and storing operator information into the data storage unit;

u) Parsing data files by extracting and storing generation time and date into the data storage unit;

v) Parsing data files by extracting and storing test number into the data storage unit;

w) Parsing data files by extracting and storing test description into the data storage unit;

x) Parsing data files by extracting and storing data status into the data storage unit;

y) Parsing data files by extracting and storing continuous data lower specification limit into the data storage unit;

z) Parsing data files by extracting and storing continuous data upper specification limit into the data storage unit;

aa) Parsing data files by extracting and storing actual measured values into the data storage unit;

bb) Parsing data files by extracting and storing expected values into the data storage unit;

cc) Parsing data files by extracting and storing attribute actual values into the data storage unit;

dd) Parsing data files by extracting and storing data type into the data storage unit;

ee) Parsing data files by extracting and storing parameters units into the data storage unit;

ff) Parsing data files by extracting and storing pass/fail field into the data storage unit;

gg) Repeat steps k-ff for each data file selected;

hh) Updating graphical user interface display information;

ii) Selecting a data processing method from either all data or passed data only;

jj) For all data, characterizing and analyzing the entire data set;

kk) For pass data only, characterizing and analyzing passed data only within the specification limits for continuous data;

ll) Selecting a scoring method from individual or grouped;

mm) For individual scoring;

a separate scorecard is produced for each selected product part number with its respective revision level;

nn) For grouped scoring;

a single scorecard is produced for all selected product part numbers with their respective revision levels;

oo) Determining if continuous or attribute data is being processed;

pp) For continuous data, calculating each parameter'"'"'s mean and store into the data storage unit;

qq) For continuous data, calculating each parameter'"'"'s standard deviation and store into the data storage unit;

rr) For continuous data, calculating each parameter'"'"'s upper Z-Score or Z-Value and store into the data storage unit;

ss) For continuous data, calculating each parameter'"'"'s lower Z-Score or Z-Value and store into the data storage unit;

tt) For continuous data, calculating each parameter'"'"'s yield and store into the data storage unit;

uu) For attribute data, calculating each parameters parts per million and store into the data storage unit;

vv) For attribute data, calculating each parameters defects per unit and store into the data storage unit;

ww) Calculating the total number of parameter for each product part number that were processed;

xx) Calculating the total number of product files for each product part number that were processed;

yy) Calculating the long-term sigma score for each product part number that were processed;

zz) Calculating the short-term sigma score for each product part number that were processed;

aaa) Calculating the total number of defects per unit for each product part number;

bbb) Displaying scorecard or scorecards;

each scorecard comprising;

ccc) For continuous data;

specification limits, the actual measured data mean, standard deviation, Z-Lower and Z-Upper, Yield, defects per unit (DPU), and sigma shift factor;

ddd) For attribute data;

defects per unit and parts per million;

eee) Determining whether to store the statistical results externally;

fff) Terminating software.