LITHOGRAPHIC APPARATUS AND METHOD
First Claim
1. A lithographic method, the method comprising:
- using information at least indicative of a desired shape or size of a constituent part of a device to implement the desired shape or size of the constituent part of the device, the desired shape or size being related to a measured property of a layer of material in which the constituent part of the device is to be created, at least a part of the implementation comprising determining a configuration of a plurality of individually controllable elements that would be necessary to create in a radiation beam a pattern which is sufficient to implement the desired shape or size of the constituent part of the device when creating the constituent part of the device.
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Accused Products
Abstract
A lithographic method, among things is disclosed. The method includes using information at least indicative of a desired shape or size of a constituent part of a device to implement the desired shape or size of the constituent part of the device, the desired shape or size being related to a measured property of a layer of material in which the constituent part of the device is to be created, at least a part of the implementation comprising determining a configuration of a plurality of individually controllable elements that would be necessary to create in a radiation beam a pattern which is sufficient to implement the desired shape or size of the constituent part of the device when creating the constituent part of the device.
27 Citations
17 Claims
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1. A lithographic method, the method comprising:
using information at least indicative of a desired shape or size of a constituent part of a device to implement the desired shape or size of the constituent part of the device, the desired shape or size being related to a measured property of a layer of material in which the constituent part of the device is to be created, at least a part of the implementation comprising determining a configuration of a plurality of individually controllable elements that would be necessary to create in a radiation beam a pattern which is sufficient to implement the desired shape or size of the constituent part of the device when creating the constituent part of the device. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A lithographic apparatus, comprising:
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a plurality of individually controllable elements, configured to create a pattern in a radiation beam; a projection system, configured to project the patterned radiation beam onto a substrate; and a control arrangement, the control arrangement configured to use information at least indicative of a desired shape or size of a constituent part of a device to implement the desired shape or size of the constituent part of the device, the desired shape or size being related to a measured property of a layer of material in which the constituent part of the device is to be created, at least a part of the implementation comprising determining a configuration of a plurality of individually controllable elements that would be necessary to create in a radiation beam a pattern which is sufficient to implement the desired shape or size of the constituent part of the device when creating the constituent part of the device. - View Dependent Claims (9)
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10. A lithographic method, the method comprising:
using information at least indicative of a desired change in the shape or size of a constituent part of a first device to implement the change in the shape or size of a constituent part of a subsequently created second device, at least a part of the implementation comprising determining a configuration of a plurality of individually controllable elements of a lithographic apparatus that would be necessary to create in a radiation beam a pattern which is sufficient to implement the desired change in the shape or size of the constituent part of the subsequently created second device. - View Dependent Claims (11, 12, 13, 14, 15)
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16. A lithographic apparatus, the lithographic apparatus comprising
a plurality of individually controllable elements, configured to create a pattern in a radiation beam; -
a projection system, configured to project the patterned radiation beam onto a substrate; and a control arrangement, the control arrangement being configured to use information at least indicative of a desired change in the shape or size of a constituent part of a first device to implement the change in the shape or size of a constituent part of a subsequently created second device, at least a part of the implementation comprising determining a configuration of the plurality of individually controllable elements that would be necessary to create in the radiation beam a pattern which is sufficient to implement the desired change in the shape or size of the constituent part of the subsequently created second device. - View Dependent Claims (17)
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Specification