SEMICONDUCTOR COLOR-TUNABLE BROADBAND LIGHT SOURCES AND FULL-COLOR MICRODISPLAYS
First Claim
1. A light sources apparatus, comprising:
- a first light emitting diode for emitting light having a first wavelength, the first light emitting diode comprising angled facets to reflect incident light in a direction toward a top end of the first light emitting diode;
a second light emitting diode for emitting light having a second wavelength, the second light emitting diode being disposed above the top end of the first light emitting diode, and the second light emitting diode comprising angled facets to reflect incident light in a direction toward a top end of the second light emitting diode; and
a first distributed Bragg reflector disposed between the top end of the first light emitting diode and a bottom end of the second light emitting diode to allow light from the first light emitting diode to pass through and to reflect light from the second light emitting diode.
2 Assignments
0 Petitions
Accused Products
Abstract
Methods and systems are provided that may be used to utilize and manufacture a light sources apparatus. A first light emitting diode emits light having a first wavelength, and a second light emitting diode for emitting light having a second wavelength. Each of the first and second light emitting diodes may comprise angled facets to reflect incident light in a direct toward a top end of the first light emitting diode. The second light emitting diode comprising angled facets may reflect incident light in a direction toward a top end of the second light emitting diode. A first distributed Bragg reflector is disposed between the top end of the first light emitting diode and a bottom end of the second light emitting diode to allow light from the first light emitting diode to pass through and to reflect light from the second light emitting diode.
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Citations
32 Claims
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1. A light sources apparatus, comprising:
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a first light emitting diode for emitting light having a first wavelength, the first light emitting diode comprising angled facets to reflect incident light in a direction toward a top end of the first light emitting diode; a second light emitting diode for emitting light having a second wavelength, the second light emitting diode being disposed above the top end of the first light emitting diode, and the second light emitting diode comprising angled facets to reflect incident light in a direction toward a top end of the second light emitting diode; and a first distributed Bragg reflector disposed between the top end of the first light emitting diode and a bottom end of the second light emitting diode to allow light from the first light emitting diode to pass through and to reflect light from the second light emitting diode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. An optoelectronic device comprising a stack of monochromatic microdisplays, the stack of monochromatic microdisplays comprising:
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a first microdisplay to emit light having a first wavelength; at least a second microdisplay to emit light having a second wavelength, the first wavelength being different from the second wavelength; and a distributed Bragg reflector disposed between the first microdisplay and the at least a second microdisplay to allow light from the first microdisplay to pass through and to reflect light from the at least a second microdisplay. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25, 26, 27, 28)
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29. A wafer dicing process of electronic and optoelectronic devices based on laser micromachining to form diced chips with angled facets, the wafer dicing process comprising:
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providing a processed wafer with multiple fabricated devices on an upper surface; directing a laser beam at the wafer surface for wafer dicing; reflecting the laser beam off a laser mirror, wherein the laser beam is incident onto the processed wafer at an oblique angle from a vertical axis, the incident beam forming a trench at a point of incidence by removal of semiconductor, metal or insulator materials; translating the processed wafer so that the laser beam forms a trench around a periphery of devices on the processed wafer. - View Dependent Claims (30, 31, 32)
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Specification