PHOTOELECTROCHEMICAL ETCHING FOR CHIP SHAPING OF LIGHT EMITTING DIODES
First Claim
1. A method for fabricating a semiconductor device, comprising:
- performing a photoelectrochemical (PEC) etch for chip shaping of a device comprised of a III-V semiconductor material in order to extract light emitted into guided modes trapped in the III-V semiconductor material.
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Accused Products
Abstract
A photoelectrochemical (PEC) etch is performed for chip shaping of a device comprised of a III-V semiconductor material, in order to extract light emitted into guided modes trapped in the III-V semiconductor material. The chip shaping involves varying an angle of incident light during the PEC etch to control an angle of the resulting sidewalls of the III-V semiconductor material. The sidewalls may be sloped as well as vertical, in order to scatter the guided modes out of the III-V semiconductor material rather than reflecting the guided modes back into the III-V semiconductor material. In addition to shaping the chip in order to extract light emitted into guided modes, the chip may be shaped to act as a lens, to focus its output light, or to direct its output light in a particular way.
76 Citations
29 Claims
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1. A method for fabricating a semiconductor device, comprising:
performing a photoelectrochemical (PEC) etch for chip shaping of a device comprised of a III-V semiconductor material in order to extract light emitted into guided modes trapped in the III-V semiconductor material. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A light emitting diode (LED), comprising:
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III-Nitride semiconductor material including an active region for generating and emitting light; wherein the III-Nitride semiconductor material includes one or more etched surfaces that have a surface smoothness; wherein the etched surfaces have an inclination at one or more sloped angles relative to a light emitting surface of the active region; and wherein the surface smoothness and the inclination of the etched surfaces enhance extraction of the light emitted into guided modes trapped in the III-Nitride semiconductor material. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
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26. A method for wafer dicing, comprising using photoelectrochemical (PEC) etching to dice a wafer into distinct device chips.
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27. An apparatus for fabricating a semiconductor device, comprising:
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an electrochemical cell for chemically etching a III-V semiconductor material during a photoelectrochemical (PEC) etch; a light source for emitting incident light onto the III-V semiconductor material; and means for re-positioning the incident light relative to the III-V semiconductor material in the electrochemical cell, wherein the means for re-positioning varies an angle of the incident light during the PEC etch to control an angle of resulting sidewalls of the III-V semiconductor material, thereby chip shaping the device comprised of the III-V semiconductor material in order to extract light emitted into guided modes trapped in the III-V semiconductor material. - View Dependent Claims (28, 29)
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Specification