Optical phase reference

• US 20100102214A1
• Filed: 10/28/2008
• Published: 04/29/2010
• Est. Priority Date: 10/28/2008
• Status: Active Grant

• Current Assignee: Finesse Solutions, Inc. (Thermo Fisher Scientific Incorporated)
• Original Assignee: Finesse Solutions LLC
• Inventors: Pruitt, Edward, Blizard, Benjamin, Kamas, Charles
• Granted Patent: US 7,968,840 B2
• Time in Patent Office: Days
• US Class Current: 250/252.100
• CPC Class Codes: G01N 21/6428 Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" in vivo A61B5/00; immunoassay G01N33/53

Abstract

A validation apparatus for testing the measurement accuracy of a phase fluorimeter comprising:

i) a photodetector responsive to the excitation light emitted by a phase fluorimeter;
ii) electronics connected to the detector which calculates the phase of the light emitted by the phase fluorimeter and causes a light source in the validation apparatus to emit light of a wave length which will stimulate the detector of the phase fluorimeter but which is phase shifted relative to the light emitted by the phase fluorimeter.

Claims

1. A validation apparatus for testing the measurement accuracy of a phase fluorimeter comprising:

i) a photo-detector responsive to the excitation light emitted by a phase fluorimeter;

ii) electronics connected to said validation apparatus photo-detector which calculates the phase of the light emitted by the phase fluorimeter and causes

iii) a light source present in the validation apparatus to emit light of a wave length which will stimulate a detector of the phase fluorimeter but which is phase shifted relative to the excitation light emitted by the phase fluorimeter.

2. Apparatus in accordance with claim 1, further comprising optical elements for directing the light emitted by said validation apparatus light source through an optical filter which passes only light of a wave length which will stimulate the detector of the phase fluorimeter.

3. An apparatus in accordance with claim 1 further comprising:

a thermal actuator suitable for being placed in thermal contact with a temperature measuring device of the phase fluorimeter

4. An apparatus in accordance with claim 1 wherein said light source is an LED or diode laser.

5. An apparatus in accordance with claim 3 wherein said actuator is a thermo-electric cooler.

6. An apparatus in accordance with claim 3 wherein said thermal contact is achieved using indium foil.

7. A validation apparatus in accordance with claim 1 further comprising a second optical filter which passes to said validation apparatus photo detector only light emitted by the phase fluorimeter;

8. A process for testing the measurement accuracy of a phase fluorimeter comprising the steps of:

i) passing to the photo detector of a validation apparatus in accordance with claim 1, light emitted by said phase fluorimeter,

ii) calculating the phase of the light emitted by the phase fluorimeter and causing a light source present in said validation apparatus to emit light of a wave length which will stimulate a detector of the phase fluorimeter but which emitted light is phase shifted relative the light emitted by the phase fluorimeter;

iii) directing the light emitted by said validation apparatus light source to the detector of the phase fluorimeter and causing the fluorimeter to measure the phase delay of the directed light relative to the light emitted by the phase fluorimeter; and

iv) comparing the phase shift imparted in step ii) with the measured phase shift as reported by the fluorimeter in response to the light impinging on the detector of the phase fluorimeter.

9. A process in accordance with claim 8 comprising the additional step of setting and controlling the temperature of a thermal actuator present in said validation apparatus to test the temperature measurement components of the phase fluorimeter.

10. A process in accordance with claim 8 comprising the additional step of passing the light emitted by the phase fluorimeter through a filter of the validation apparatus which will pass to said validation apparatus photo detector only light of a wave length emitted by the phase fluorimeter;